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Materials Informatics Framework for Accelerated Discovery of High-Refractive-Index 2D Materials. [PDF]

open access: yesACS Nano
Klimova LA   +6 more
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Advanced Mueller matrix ellipsometry: Instrumentation and emerging applications

Science China Technological Sciences, 2022
Honggang Gu, Shiyuan Liu, Xiuguo Chen
exaly  

Mueller matrix spectroscopic ellipsometry

Advanced Optical Technologies, 2022
James Hilfiker   +2 more
exaly  

In situ ellipsometry studies on swelling of thin polymer films: A review

Progress in Polymer Science, 2015
Nieck E Benes   +2 more
exaly  

Application of Spectroscopic Ellipsometry and Mueller Ellipsometry to Optical Characterization

Applied Spectroscopy, 2013
Enrique Garcia Caurel   +1 more
exaly  

Optical Properties of Cu2O Studied by Spectroscopic Ellipsometry

Journal of the Physical Society of Japan, 1998
Taizo Masumi   +2 more
exaly  

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