Results 171 to 180 of about 7,247 (181)

Optical Properties of CuO Studied by Spectroscopic Ellipsometry

Journal of the Physical Society of Japan, 1998
Hirotaka Yamaguchi, Taizo Masumi, Adachi Sadao   +2 more
exaly  

Measurement of Dynamic Interfacial Properties in an Overflowing Cylinder by Ellipsometry

Journal of Colloid and Interface Science, 1997
, Richard Darton
exaly  

Spectroscopic ellipsometry data analysis: measured versus calculated quantities

Thin Solid Films, 1998
G E Jellison
exaly  

Comparison of Si surface roughness measured by atomic force microscopy and ellipsometry

Applied Physics Letters, 1996
Helms C R
exaly  

Spectroscopic ellipsometry and thermoreflectance of GaAs

Journal of Applied Physics, 1995
Adachi Sadao
exaly  

Spatially resolved ellipsometry

Journal of Applied Physics, 1986
Erman M
exaly  

Protein absorption and ellipsometry in biomaterial research

Biomaterials, 1998
Hans Elwing
exaly  

Low-temperature growth of silicon dioxide films: A study of chemical bonding by ellipsometry and infrared spectroscopy

Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1987
Lucovsky G, Irène E A
exaly  

Total internal reflection ellipsometry: principles and applications

Applied Optics, 2004
Hans Arwin
exaly  

The improvement of phase modulated spectroscopic ellipsometry

Review of Scientific Instruments, 1992
exaly