Results 171 to 180 of about 49,913 (189)
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Low-temperature growth of silicon dioxide films: A study of chemical bonding by ellipsometry and infrared spectroscopy

Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1987
exaly  

Multichannel Ellipsometry

2005
Robert W. Collins   +3 more
openaire   +1 more source

Competitive Protein Adsorption Studied with TIRF and Ellipsometry

Journal of Colloid and Interface Science, 1996
exaly  

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