An exploration of the electromagnetic boundary conditions for two-dimensional materials with out-of-plane polarization. [PDF]
Hansen A, Mišković ZL.
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Ellipsometric Characterization of Network Topology Transition in Vitrimers. [PDF]
Wang Y +6 more
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Tracking Lithium Intercalation in Battery Electrodes via Their Electrochromic Properties Using <i>Operando</i> Ellipsometry. [PDF]
Gu J +5 more
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High-Throughput Surface Modification of Ordered Mesoporous Alumina Enables Structural Stabilization and Selective Chemical Control. [PDF]
Bindon S, Colburn TW, Dauskardt RH.
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Comparative Study of Nanocrystalline Dysprosium Oxide Thin Films Deposited on Quartz Glass and Sapphire Substrates by Means of Electron Beam. [PDF]
Alresheedi F.
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Dispersion Compensation and Multi-Beam Interference Correction Algorithm for Thickness Measurement of SiC Epitaxial Layer. [PDF]
Liu L, Shi W, Xu S, Wang X.
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Anion- and Cation-Specific Response of the Aqueous Conformation of Strong and Weak Polyanionic Brushes. [PDF]
Bertei C, Bilotti E, Gautrot JE.
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Optical, Structural, and Charge Transport Properties of Individual Ti<sub>3</sub>C<sub>2</sub>T<sub><i>x</i></sub> MXene Flakes via Micro-Ellipsometry and Beyond. [PDF]
Kenaz R +9 more
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Bridging the scalability gap in van der Waals light guiding with high refractive index MoTe<sub>2</sub>. [PDF]
Tatmyshevskiy MK +13 more
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Perylene Dye as a Measure of Dynamic Free Volume, Fragility, and Dynamic Glass Transition in Thin Polystyrene Films. [PDF]
Yadav S, Roth CB.
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