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Materials Today, 2003 Some of the next articles are maybe not open access.
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Lateral ellipsometry resolution for imaging ellipsometry measurement
Japanese Journal of Applied Physics, 2021Abstract As an approach to integrate both single-point measurement ellipsometry and optical microscopy, imaging ellipsometry possesses the capability of measurement of distributions of optical constants and/or thickness of sample surfaces.
Lianhua Jin +4 more
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Materials and Corrosion, 1968
AbstractDie Ellipsometrie, das heißt die Messung der Dicke von dünnen Filmen, ist in den letzten Jahren zunehmend zu Korrosionsuntersuchungen eingesetzt worden. Deu Verfasser beschreibt die Grundlagen der Methode sowie den Aufbau der Meßeinrichtungen und gibt Beispiele für die Anwendung auf dem Korrosionsgebiet, besonders in Zusammenhang mit der ...
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AbstractDie Ellipsometrie, das heißt die Messung der Dicke von dünnen Filmen, ist in den letzten Jahren zunehmend zu Korrosionsuntersuchungen eingesetzt worden. Deu Verfasser beschreibt die Grundlagen der Methode sowie den Aufbau der Meßeinrichtungen und gibt Beispiele für die Anwendung auf dem Korrosionsgebiet, besonders in Zusammenhang mit der ...
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Applied Optics, 1984
An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
T, Yoshino, K, Kurosawa
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An all-fiber ellipsometer is constructed which uses a polarization-maintaining single-mode fiber as the polarization modulator. It is demonstrated that the all-fiber ellipsometer can be used to determine the optical constants of materials and as a surface state sensor.
T, Yoshino, K, Kurosawa
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Applied Optics, 1985
An ellipsometer is described which is capable of measuring one of the related ellipsometric parameters N, S, or C as a function of time. The ellipsometer is of the standard polarizer–compensator–sample–analyzer type, in which the analyzer is a Wollaston prism.
G E, Jellison, D H, Lowndes
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An ellipsometer is described which is capable of measuring one of the related ellipsometric parameters N, S, or C as a function of time. The ellipsometer is of the standard polarizer–compensator–sample–analyzer type, in which the analyzer is a Wollaston prism.
G E, Jellison, D H, Lowndes
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Rotating depolarizer ellipsometry
Applied Optics, 1977We have built a fully automatic ellipsometer, which is spectroscopic and of the single rotating optical component type but which avoids two serious problems encountered in rotating analyzer ellipsometers.
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IEEE Journal of Quantum Electronics, 1981
A method for achieving the ultrahigh sensitivity required for surface vibrational spectroscopy is proposed. Polarization selective heterodyne detection permits shot-noise limited submonolayer detection with classically noisy picosecond laser sources.
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A method for achieving the ultrahigh sensitivity required for surface vibrational spectroscopy is proposed. Polarization selective heterodyne detection permits shot-noise limited submonolayer detection with classically noisy picosecond laser sources.
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