Results 11 to 20 of about 78,934 (289)
Temperature dependent optical constants for SiO2 film on Si substrate by ellipsometry
Materials Research Express, 2017 In situ ellipsometry measurements in the spectra range from 246 to 1000 nm were performed on a SiO _2 /Si system at temperatures varying from 25 to 600 °C.
Junbo Gong +5 more
doaj +2 more sources
Fast and Sensitive Ellipsometry-Based Biosensing
Sensors, 2017 In this work, a biosensing method based on in situ, fast, and sensitive measurements of ellipsometric parameters (Ψ, ∆) is proposed. Bare silicon wafer substrate is functionalized and used to bind biomolecules in the solution.
Kewu Li +6 more
doaj +2 more sources
Metasurface array for single-shot spectroscopic ellipsometry [PDF]
Light: Science & Applications, 2023 Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. Most conventional ellipsometers utilize mechanically rotating polarizers and grating-based spectrometers for ...
Shun Wen +5 more
semanticscholar +1 more source
ACM Transactions on Graphics, 2022 Ellipsometry techniques allow to measure polarization information of materials, requiring precise rotations of optical components with different configurations of lights and sensors. This results in cumbersome capture devices, carefully calibrated in lab
Inseung Hwang +5 more
semanticscholar +1 more source
Spectroscopy Journal, 2023 Spectroscopic ellipsometry (SE), a non-invasive optical technique, is a powerful tool for characterizing surfaces, interfaces, and thin films. By analyzing the change in the polarization state of light upon reflection or transmission through a sample ...
G. Politano, C. Versace
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ACS Omega, 2022 The optical properties of various PEDOT:PSS films obtained by drop casting and blade coating are analyzed by variable-angle spectroscopic ellipsometry in the visible-UV spectral range.
Minghua Kong +3 more
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Mueller matrix spectroscopic ellipsometry
Advanced Optical Technologies, 2022 The Mueller matrix is a mathematical description of how light is altered by an optical element or a sample under study. It describes both intensity (irradiance) and polarization changes, including a reduction of the total polarization.
J. Hilfiker, N. Hong, Stefan Schoeche
semanticscholar +1 more source
Machine learning powered ellipsometry
Light: Science & Applications, 2021 Ellipsometry is a powerful method for determining both the optical constants and thickness of thin films. For decades, solutions to ill-posed inverse ellipsometric problems require substantial human–expert intervention and have become essentially human ...
Jinchao Liu +4 more
semanticscholar +1 more source
Broadband femtosecond spectroscopic ellipsometry.
Review of Scientific Instruments, 2021 We present a setup for time-resolved spectroscopic ellipsometry in a pump-probe scheme using femtosecond laser pulses. As a probe, the system deploys supercontinuum white light pulses that are delayed with respect to single-wavelength pump pulses.
S. Richter +5 more
semanticscholar +1 more source