Results 31 to 40 of about 49,913 (189)

APPLICATION OF THE EFFECTIVE IMPEDANCE METHOD FOR IN SITU ELLIPSOMETRIC ANALYSIS OF MAGNETIC FILMS [PDF]

Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов, 2013
The technique of effective surface impedance is proposed and applied as useful tool for non-destructive in situ characterisation of optical and magneto-optical parameters of magnetic heterostructures.
L.V. Panina, A.T. Morchenko, V.G. Kostishyn, D.N. Chitanov, R.D. Piliposyan   +4 more
doaj  

Ellipsometry and optical spectroscopy of low-dimensional family TMDs

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017
Here, we report a comprehensive study of fundamental optical properties of two-dimensional materials. These properties have been ascertained using spectroscopic ellipsometry, optical spectroscopy of Raman scattering, and photoluminescence.
V.G. Kravets, V.V. Prorok, L.V. Poperenko, I.A. Shaykevich   +3 more
doaj   +1 more source

The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry

, 2018
Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods.
Alles, Harry, Kahro, Tauno, Kasikov, Aarne, Kodu, Margus, Matisen, Leonard, Seemen, Helina, Tarre, Aivar   +6 more
core   +1 more source

Optical properties of MgH2 measured in situ in a novel gas cell for ellipsometry/spectrophotometry [PDF]

, 2003
The dielectric properties of alpha-MgH2 are investigated in the photon energy range between 1 and 6.5 eV. For this purpose, a novel sample configuration and experimental setup are developed that allow both optical transmission and ellipsometric ...
A. Borgschulte, A. Fischer, A. Krozer, A. Krozer, A. Krozer, A. Krozer, A. Zaluska, B. Darriet, B. Pfrommer, B.D. Johs, B.M. Geerken, C. Jouanin, C.-Y. Xiao, D. Sun, D.E. Aspnes, D.G. Nagengast, D.M. Roessler, D.R. Penn, E.L. Shirley, E.S. Kooij, F. Favier, F. Gygi, F.C. Brown, F.H. Ellinger, G. Liang, G.E. Jellison, Jr., H. Arwin, H.F. Franzen, I. A. M. E. Giebels, I.A.M.E. Giebels, J. Isidorsson, J. Isidorsson, J. Isidorsson, J. Isidorsson, J. Rydén, J. Tauc, J. Thomas, J.F. Pelletier, J.H. Weaver, J.N. Huiberts, J.P. Bastide, K. Järrendahl, K. von Rottkay, K. Yamamoto, L. Schlapbach, L.J. van der Pauw, Lord Rayleigh, M. Bortz, M. Di Vece, M. Di Vece, M. Gupta, O. Dankert, P. Hjort, P. Selvam, P. Spatz, P. Vajeeston, P. van der Sluis, P.H.L. Notten, P.K. de Boer, P.K. de Boer, P.T. Sprunger, R. Del Sole, R. Griessen, R. Griessen, R. Yu, S. Baroni, S.J. van der Molen, S.J. van der Molen, T. Schober, T.J. Richardson, U. Häussermann, U. Schönberger, W.A. McGahan, W.H. Strehlow, W.Y. Ching, Z. Dehouche, Z. Luz, Z.X. He   +77 more
core   +2 more sources

Stable dielectric response of low-loss aromatic polythiourea thin films on Pt/SiO2 substrate [PDF]

Journal of Advanced Dielectrics, 2016
We have investigated dielectric properties of aromatic polythiourea (ArPTU, a polar polymer containing high dipolar moments with very low defect levels) thin films that were developed on Pt/SiO2 substrate.
A. Eršte, L. Fulanović, L. Čoga, M. Lin, Y. Thakur, Q. M. Zhang, V. Bobnar   +6 more
doaj   +1 more source

Low-temperature far-infrared ellipsometry of convergent beam

, 1998
Development of an ellipsometry to the case of a coherent far infrared irradiation, low temperatures and small samples is described, including a decision of the direct and inverse problems of the convergent beam ellipsometry for an arbitrary wavelength ...
A. B. Sushkov, A. B. Sushkov, D. R. Smith, E. A. Tishchenko, G. Brandli, J. C. Galzerani, J. W. Goodman, K. F. Pai, K.-L. Barth, M. A. Ordal, R. M. Azzam, R. O. DeNicola, V. I. Nijankovskii, V. N. Denisov   +13 more
core   +2 more sources

Ultra-bright emission from Sr doped TiO2 nanoparticles through r-GO conjugation [PDF]

Royal Society Open Science, 2019
Graphene and semiconductor nanocomposite garnered much interest in nanoscience and nanotechnology. In this research, TiO2, TiO2: Sr and TiO2: Sr/r-GO (reduced graphene oxide) nanocomposites have been successfully synthesized via a wet chemical synthesis ...
Sanhita Mandal, Neha Jain, Mukesh Kumar Pandey, S. S. Sreejakumari, Prashant Shukla, Anupama Chanda, Sudipta Som, Subrata Das, Jai Singh   +8 more
doaj   +1 more source

Free-charge carrier parameters of n-type, p-type and compensated InN:Mg determined by Infrared Spectroscopic Ellipsometry

, 2013
Infrared spectroscopic ellipsometry is applied to investigate the free-charge carrier properties of Mg-doped InN films. Two representative sets of In-polar InN grown by molecular beam epitaxy with Mg concentrations ranging from $1.2\times10^{17}$ cm$^{-3}
Araki, T., Darakchieva, V., Hofmann, T., Nanishi, Y., Schubert, M., Schöche, S., Wang, K., Wang, X., Yoshikawa, A.   +8 more
core   +1 more source

Optical Study of Ultrathin TiO2 Films for Photovoltaic and Gas Sensing Applications

Medžiagotyra, 2014
TiO2 ultrathin films of thickness below 20 nm were deposited by reactive RF magnetron sputtering. The optical properties of TiO2 films were investigated by various optical techniques including UV-VIS-NIR spectroscopic ellipsometry.
Arturas SUCHODOLSKIS, Alfonsas RĖZA, Virginijus BUKAUSKAS, Audružis MIRONAS, Arūnas ŠETKUS, Irena ŠIMKIENĖ   +5 more
doaj   +1 more source

Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index [PDF]

, 2018
A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential ...
Marcelo, Gema, Martín del Valle, Eva M., Pecharromán, Carlos, Perez, Maximiliano Sebastian, Vega Moreno, Milena Amparo   +4 more
core   +1 more source