Results 11 to 20 of about 31,024 (191)

spectroscopic ellipsometry (SE) ()

dataset for spectroscopic ellipsometry ...
Pilz, Lena
core   +30 more sources

Analysis of Toxic Amyloid Fibril Interactions at Natively Derived Membranes by Ellipsometry [PDF]

, 2015
There is an ongoing debate regarding the culprits of cytotoxicity associated with amyloid disorders. Although small pre-fibrillar amyloid oligomers have been implicated as the primary toxic species, the fibrillar amyloid material itself can also induce ...
Smith, Rachel A. S., Xue, Wei-Feng, Blakeman Ben J. F., Blakeman, Ben J. F., Smith, David P., Benjamin Abell (769585), Rachel A S Smith, David P. Smith (131751), Benjamin Abell, Wei-Feng Xue (610029), Ben J F Blakeman, Aleksey Nabok, David P Smith, Rachel A. S. Smith (769582), Smith Rachel A. S., Xue Wei-Feng, Nabok Aleksey, Abell Benjamin, Wei-Feng Xue, Ben J. F. Blakeman (769584), Abell, Benjamin, Aleksey Nabok (769583), Smith David P., Nabok, Aleksey, Leonenko, Zoya   +24 more
core   +2 more sources

Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

, 2023
As performance of van der Waals heterostructure devices is governed by the nanoscale thicknesses and homogeneity of their constituent mono- to few-layer flakes, accurate mapping of these properties with high lateral resolution becomes imperative ...
Kenji Watanabe (75040), Saptarshi Ghosh, Hadar Steinberg, Ronen Rapaport (1460674), Kenji Watanabe, Ronen Rapaport, Pradheesh Ramachandran (14364018), Saptarshi Ghosh (1656340), Pradheesh Ramachandran, Ralfy Kenaz, Ralfy Kenaz (14364015), Takashi Taniguchi, Takashi Taniguchi (331592), Hadar Steinberg (2246053)   +13 more
core   +1 more source

The study of genomic DNA adsorption and subsequent interactions using total internal reflection ellipsometry. [PDF]

, 2007
The adsorption of genomic DNA and subsequent interactions between adsorbed and solvated DNA was studied using a novel sensitive optical method of total internal reflection ellipsometry (TIRE), which combines spectroscopic ellipsometry with surface ...
Nabok, Alexei, Tsargorodskaya, A., Higson, Seamus P. J., Nabok, A. V., Davis, F., Tsargorodskaya, Anna, Davis, Frank, Higson, S. P. J.   +7 more
core   +1 more source

Expanded beam (macro-imaging) ellipsometry

, 2022
S.2730-2736Our aim was to make possible to use spectroscopic ellipsometry for mapping purposes during one measuring cycle (minimum one rotation period of polarizer or analyzer) on many sample points.
Petrik, P., Nutsch, A., Juhasz, G., Fried, M., Major, C., Horvath, Z., Polgar, O.   +6 more
core   +1 more source

Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

, 2022
S.433-437Silica xerogel films with low dielectric constant were prepared by means of a sol-gel spin-coating method using different aging and hydrophobisation conditions.
Himcinschi, C., Frühauf, S., Gessner, T., Zahn, D.R.T., Friedrich, M., Schulz, S.E.   +5 more
core   +1 more source

Evaluation of Crystalline Volume Fraction of Laser-Annealed Polysilicon Thin Films Using Raman Spectroscopy and Spectroscopic Ellipsometry

Micromachines, 2021
We investigated the crystallinities of poly silicon (poly Si) annealed via green laser annealing (GLA) with a 532-nm pulsed laser and blue laser annealing (BLA) with 450-nm continuous-wave lasers.
Jeongsang Pyo, Bohae Lee, Han-Youl Ryu
doaj   +1 more source

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Applied Sciences, 2022
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson, Giselle Rosetta, John J. Tomes   +2 more
doaj   +1 more source

Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co [PDF]

Журнал нано- та електронної фізики, 2013
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm.
A.T. Morchenko, L.V. Panina, V.G. Kostishyn, N.A. Yudanov, S.P. Kurochka, A.A. Sergienko, R.D. Piliposyan, N.N. Krupa   +7 more
doaj  

Method for Analyzing the Measurement Error with Respect to Azimuth and Incident Angle for the Rotating Polarizer Analyzer Ellipsometer

Crystals, 2021
We proposed a method to study the effects of azimuth and the incident angle on the accuracy and stability of rotating polarizer analyzer ellipsometer (RPAE) with bulk Au.
Huatian Tu, Yuxiang Zheng, Yao Shan, Yao Chen, Haotian Zhang, Rongjun Zhang, Songyou Wang, Jing Li, YoungPak Lee, Liangyao Chen   +9 more
doaj   +1 more source