Results 11 to 20 of about 7,247 (181)
Fundamentals and applications of spectroscopic ellipsometry
Química Nova, 2002 This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are ...
Débora Gonçalves, Eugene A. Irene
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Argon irradiation effects on the structural and optical properties of reactively sputtered CrN films [PDF]
Science of Sintering, 2015 The present study deals with CrN films irradiated at room temperature (RT) with 200 keV Ar+ ions. The CrN layers were deposited by d.c. reactive sputtering on Si (100) wafers, at nitrogen partial pressure of 5×10-4 mbar, to a total thickness of ...
Novaković M., Popović M., Bibić N.
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Molecules, 2022 Two macrocyclic Schiff bases derived from o-phenylenediamine and 2-hydroxy-5-methylisophthalaldehyde L1 or 2-hydroxy-5-tert-butyl-1,3-benzenedicarboxaldehyde L2, respectively, were obtained and characterized by X-ray crystallography and spectroscopy (UV ...
Magdalena Barwiolek +7 more
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Plasma Polymerized Organosilicon Thin Films for Volatile Organic Compound (VOC) Detection
Plasma, 2023 Plasma polymerized (PP) thin films deposited in a soft or intermediate plasma discharge from hexamethyldisiloxane (HMDSO) were developed as sensors for the detection of volatile organic compound (VOC) vapors.
Ghadi Dakroub +6 more
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Frontiers in Physics, 2021 The sesquioxide Lu2O3 single crystal has attracted tremendous attention as potential host material for high-power solid-state lasers. As polishing is the terminal process of conventional ultra-precision machining, the quality of polished crystal directly
Chengyuan Yao +4 more
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Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co [PDF]
Журнал нано- та електронної фізики, 2013 Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm.
A.T. Morchenko +7 more
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Materials Research Express, 2023 Manganese-doped indium tin oxide (ITO) thin films (0–12.8 at% Mn) were deposited by DC magnetron sputtering. The structural, electrical, and optical properties of the films were studied.
Masoud Kaveh +5 more
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Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique [PDF]
Engineering and Technology Journal, 2010 An Ellipsometric experimental set up of SOPRA ES4G type with a powerfulWVASE software for the theoretical calculus of the Ellipsometry parameters. TheEllipsometry Technique can determine amplitude and phase information Ψ( and Δ)dependent on wavelength ...
Asad Sabih Mohammad Raouf
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Temperature dependent optical constants for SiO2 film on Si substrate by ellipsometry
Materials Research Express, 2017 In situ ellipsometry measurements in the spectra range from 246 to 1000 nm were performed on a SiO _2 /Si system at temperatures varying from 25 to 600 °C.
Junbo Gong +5 more
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APPLICATION OF THE EFFECTIVE IMPEDANCE METHOD FOR IN SITU ELLIPSOMETRIC ANALYSIS OF MAGNETIC FILMS [PDF]
Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов, 2013 The technique of effective surface impedance is proposed and applied as useful tool for non-destructive in situ characterisation of optical and magneto-optical parameters of magnetic heterostructures.
L.V. Panina +4 more
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