Results 11 to 20 of about 49,913 (189)

Neutron ellipsometry

open access: yesJournal of Magnetism and Magnetic Materials, 1993
We discuss the similarities which exist between the reflection of neutrons from ferromagnetic media and the reflection of light from media rendered gyrotropic by the application of a magnetic field, and show that the vector character of the neutron polarisation can be fully exploited in spin-analysed neutron reflection measurements (termed 'neutron ...
Bland, J   +3 more
openaire   +1 more source

Optical properties of carbon nanofiber photonic crystals [PDF]

open access: yes, 2010
Carbon nanofibers (CNF) are used as components of planar photonic crystals. Square and rectangular lattices and random patterns of vertically aligned CNF were fabricated and their properties studied using ellipsometry.
A I Fernandez-Dominguez   +17 more
core   +3 more sources

Experimental and Theoretical Studies of the Optical Properties of the Schiff Bases and Their Materials Obtained from o-Phenylenediamine

open access: yesMolecules, 2022
Two macrocyclic Schiff bases derived from o-phenylenediamine and 2-hydroxy-5-methylisophthalaldehyde L1 or 2-hydroxy-5-tert-butyl-1,3-benzenedicarboxaldehyde L2, respectively, were obtained and characterized by X-ray crystallography and spectroscopy (UV ...
Magdalena Barwiolek   +7 more
doaj   +1 more source

Plasma Polymerized Organosilicon Thin Films for Volatile Organic Compound (VOC) Detection

open access: yesPlasma, 2023
Plasma polymerized (PP) thin films deposited in a soft or intermediate plasma discharge from hexamethyldisiloxane (HMDSO) were developed as sensors for the detection of volatile organic compound (VOC) vapors.
Ghadi Dakroub   +6 more
doaj   +1 more source

Fundamentals and applications of spectroscopic ellipsometry

open access: yesQuímica Nova, 2002
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are ...
Débora Gonçalves, Eugene A. Irene
doaj   +1 more source

Argon irradiation effects on the structural and optical properties of reactively sputtered CrN films [PDF]

open access: yesScience of Sintering, 2015
The present study deals with CrN films irradiated at room temperature (RT) with 200 keV Ar+ ions. The CrN layers were deposited by d.c. reactive sputtering on Si (100) wafers, at nitrogen partial pressure of 5×10-4 mbar, to a total thickness of ...
Novaković M., Popović M., Bibić N.
doaj   +1 more source

Surface and Subsurface Quality Assessment of Polished Lu2O3 Single Crystal Using Quasi-Brewster Angle Technique

open access: yesFrontiers in Physics, 2021
The sesquioxide Lu2O3 single crystal has attracted tremendous attention as potential host material for high-power solid-state lasers. As polishing is the terminal process of conventional ultra-precision machining, the quality of polished crystal directly
Chengyuan Yao   +4 more
doaj   +1 more source

Ion-implantation induced anomalous surface amorphization in silicon [PDF]

open access: yes, 1994
Spectroscopic ellipsometry (SE), high-depth-resolution Rutherford backscattering (RBS) and channeling have been used to examine the surface damage formed by room temperature N and B implantation into silicon.
Fried, M.   +8 more
core   +3 more sources

Ellipsometry, transmission, and photoluminescence characterization of Mn-doped ITO thin films deposited by DC magnetron sputtering

open access: yesMaterials Research Express, 2023
Manganese-doped indium tin oxide (ITO) thin films (0–12.8 at% Mn) were deposited by DC magnetron sputtering. The structural, electrical, and optical properties of the films were studied.
Masoud Kaveh   +5 more
doaj   +1 more source

Optical Characterisation of RF Sputter Coated Palladium Thin Films for Hydrogen Sensing [PDF]

open access: yes, 2011
We investigate the optical properties of Pd thin films of the thickness 20-100nm deposited on Si wafer via RF sputter coating. The Pd samples are characterised using white light interfermometry for thickness and ellipsometry for refractive index.
Barton, James   +5 more
core   +1 more source

Home - About - Disclaimer - Privacy