Results 11 to 20 of about 24,227 (270)

Variable Angle Spectroscopic Ellipsometry Characterization of Graphene Oxide in Methanol Films

Crystals, 2022
It has been widely established that solvents modify the functional groups on the graphene oxide (GO) basal plane and, thus, modify its reactivity. Despite the increasing interest in GO films, a less studied aspect is the influence of methanol on the ...
Grazia Giuseppina Politano, Carlo Versace   +1 more
doaj   +1 more source

Expanded beam (macro-imaging) ellipsometry

, 2022
S.2730-2736Our aim was to make possible to use spectroscopic ellipsometry for mapping purposes during one measuring cycle (minimum one rotation period of polarizer or analyzer) on many sample points.
Petrik, P., Nutsch, A., Juhasz, G., Fried, M., Major, C., Horvath, Z., Polgar, O.   +6 more
core   +1 more source

Neutron ellipsometry

Journal of Magnetism and Magnetic Materials, 1993
We discuss the similarities which exist between the reflection of neutrons from ferromagnetic media and the reflection of light from media rendered gyrotropic by the application of a magnetic field, and show that the vector character of the neutron polarisation can be fully exploited in spin-analysed neutron reflection measurements (termed 'neutron ...
Bland, J, Hughes, H, Blundell, S, Johnson, N   +3 more
openaire   +1 more source

Analysis of Toxic Amyloid Fibril Interactions at Natively Derived Membranes by Ellipsometry [PDF]

, 2015
There is an ongoing debate regarding the culprits of cytotoxicity associated with amyloid disorders. Although small pre-fibrillar amyloid oligomers have been implicated as the primary toxic species, the fibrillar amyloid material itself can also induce ...
Smith, Rachel A. S., Xue, Wei-Feng, Blakeman Ben J. F., Blakeman, Ben J. F., Smith, David P., Benjamin Abell (769585), Rachel A S Smith, David P. Smith (131751), Benjamin Abell, Wei-Feng Xue (610029), Ben J F Blakeman, Aleksey Nabok, David P Smith, Rachel A. S. Smith (769582), Smith Rachel A. S., Xue Wei-Feng, Nabok Aleksey, Abell Benjamin, Wei-Feng Xue, Ben J. F. Blakeman (769584), Abell, Benjamin, Aleksey Nabok (769583), Smith David P., Nabok, Aleksey, Leonenko, Zoya   +24 more
core   +1 more source

Thickness Mapping and Layer Number Identification of Exfoliated van der Waals Materials by Fourier Imaging Micro-Ellipsometry

, 2023
As performance of van der Waals heterostructure devices is governed by the nanoscale thicknesses and homogeneity of their constituent mono- to few-layer flakes, accurate mapping of these properties with high lateral resolution becomes imperative ...
Kenji Watanabe (75040), Saptarshi Ghosh, Hadar Steinberg, Ronen Rapaport (1460674), Kenji Watanabe, Ronen Rapaport, Pradheesh Ramachandran (14364018), Saptarshi Ghosh (1656340), Pradheesh Ramachandran, Ralfy Kenaz, Ralfy Kenaz (14364015), Takashi Taniguchi, Takashi Taniguchi (331592), Hadar Steinberg (2246053)   +13 more
core   +1 more source

The study of genomic DNA adsorption and subsequent interactions using total internal reflection ellipsometry. [PDF]

, 2007
The adsorption of genomic DNA and subsequent interactions between adsorbed and solvated DNA was studied using a novel sensitive optical method of total internal reflection ellipsometry (TIRE), which combines spectroscopic ellipsometry with surface ...
Nabok, Alexei, Tsargorodskaya, A., Higson, Seamus P. J., Nabok, A. V., Davis, F., Tsargorodskaya, Anna, Davis, Frank, Higson, S. P. J.   +7 more
core   +1 more source

Experimental and Theoretical Studies of the Optical Properties of the Schiff Bases and Their Materials Obtained from o-Phenylenediamine

Molecules, 2022
Two macrocyclic Schiff bases derived from o-phenylenediamine and 2-hydroxy-5-methylisophthalaldehyde L1 or 2-hydroxy-5-tert-butyl-1,3-benzenedicarboxaldehyde L2, respectively, were obtained and characterized by X-ray crystallography and spectroscopy (UV ...
Magdalena Barwiolek, Dominika Jankowska, Anna Kaczmarek-Kędziera, Slawomir Wojtulewski, Lukasz Skowroński, Tomasz Rerek, Paweł Popielarski, Tadeusz M. Muziol   +7 more
doaj   +1 more source

Contributions to the static dielectric constant of low-k xerogel films derived from ellipsometry and IR spectroscopy

, 2022
S.433-437Silica xerogel films with low dielectric constant were prepared by means of a sol-gel spin-coating method using different aging and hydrophobisation conditions.
Himcinschi, C., Frühauf, S., Gessner, T., Zahn, D.R.T., Friedrich, M., Schulz, S.E.   +5 more
core   +1 more source

Plasma Polymerized Organosilicon Thin Films for Volatile Organic Compound (VOC) Detection

Plasma, 2023
Plasma polymerized (PP) thin films deposited in a soft or intermediate plasma discharge from hexamethyldisiloxane (HMDSO) were developed as sensors for the detection of volatile organic compound (VOC) vapors.
Ghadi Dakroub, Thomas Duguet, Corinne Lacaze-Dufaure, Stéphanie Roualdes, Arie van der Lee, Diane Rebiscoul, Vincent Rouessac   +6 more
doaj   +1 more source

Fundamentals and applications of spectroscopic ellipsometry

Química Nova, 2002
This paper describes the use of ellipsometry as a precise and accurate technique for characterizing substrates and overlayers. A brief historical development of ellipsometry and the basic principles necessary to understand how an ellipsometer works are ...
Débora Gonçalves, Eugene A. Irene
doaj   +1 more source