Results 21 to 30 of about 55,978 (270)

The Lyddane-Sachs-Teller relationship for polar vibrations in materials with monoclinic and triclinic crystal systems [PDF]

, 2016
A generalization of the Lyddane-Sachs-Teller relation is presented for polar vibrations in materials with monoclinic and triclinic crystal systems. The generalization is derived from an eigen displacement vector summation approach, which is equivalent to
Schubert, Mathias
core   +3 more sources

Nematic liquid crystal alignment on chemical patterns [PDF]

, 2007
Patterned Self-Assembled Monolayers (SAMs) promoting both homeotropic and planar degenerate alignment of 6CB and 9CB in their nematic phase, were created using microcontact printing of functionalised organothiols on gold films.
Acher O., Alkhairalla B., Alkhairalla B., Atherton T. J., Azzam R. M. A., Barbero G., Barmes F., Bechtold I. H., Berreman D. W., Brown C. V., C. Anquetil, Chen J., Cheng Y. L., Cleaver D. J., D. J. Cleaver, Drawhorn R. D., Gupta V. K., Horne R. G., J. P. Bramble, J. R. Henderson, James R., James R., Jerome B., Jones J. C., Kim J. H., Kim J. H., Kim J.‐H., Kumar A., Kumar S., Lee B.‐W., Lee F. K., Margelevicius M., N. J. Smith, O'Neill M., Padilla P., S. D. Evans, Satiro C., Schadt M., Scharf T., Schubert M., Smith N. J., Varghese S., Wilderbeek T. A., Wohler H., Wohler H., Yeh P., Yoneya M.   +46 more
core   +1 more source

Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co [PDF]

Журнал нано- та електронної фізики, 2013
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm.
A.T. Morchenko, L.V. Panina, V.G. Kostishyn, N.A. Yudanov, S.P. Kurochka, A.A. Sergienko, R.D. Piliposyan, N.N. Krupa   +7 more
doaj  

Ion-implantation induced anomalous surface amorphization in silicon [PDF]

, 1994
Spectroscopic ellipsometry (SE), high-depth-resolution Rutherford backscattering (RBS) and channeling have been used to examine the surface damage formed by room temperature N and B implantation into silicon.
Fried, M., Hanekamp, L.J., Khanh, N.Q., Kotai, E., Lohner, T., Nguyen, N.V., Silfhout, A. van, Toth, L., Vedam, K.   +8 more
core   +3 more sources

Temperature dependent optical constants for SiO2 film on Si substrate by ellipsometry

Materials Research Express, 2017
In situ ellipsometry measurements in the spectra range from 246 to 1000 nm were performed on a SiO _2 /Si system at temperatures varying from 25 to 600 °C.
Junbo Gong, Ruchen Dai, Zhongping Wang, Chuanchao Zhang, Xiaodong Yuan, Zengming Zhang   +5 more
doaj   +1 more source

Spectroscopic Ellipsometry and Optical Modelling of Structurally Colored Opaline Thin-Films

Applied Sciences, 2022
The method of spectroscopic ellipsometry is applied to complex periodic nanomaterials, consisting of shear-ordered polymeric nanosphere composites, with intense resonant structural color.
Chris E. Finlayson, Giselle Rosetta, John J. Tomes   +2 more
doaj   +1 more source

Vertical-Objective-Based Ellipsometric Microscope for Real-Time Observation of nm-Thick Lubricant Films

Tribology Online, 2012
The vertical-objective-based ellipsometric microscope (VEM) is expected to be a useful method for clarifying the lubrication phenomena that uses thin liquid lubricants, especially the lubricant for hard disk drives (HDDs). Although the feasibility of VEM
Liu Qingqing, Kenji Fukuzawa, Yosuke Kajihara, Hedong Zhang, Shintaro Itoh   +4 more
doaj   +1 more source

Method for Analyzing the Measurement Error with Respect to Azimuth and Incident Angle for the Rotating Polarizer Analyzer Ellipsometer

Crystals, 2021
We proposed a method to study the effects of azimuth and the incident angle on the accuracy and stability of rotating polarizer analyzer ellipsometer (RPAE) with bulk Au.
Huatian Tu, Yuxiang Zheng, Yao Shan, Yao Chen, Haotian Zhang, Rongjun Zhang, Songyou Wang, Jing Li, YoungPak Lee, Liangyao Chen   +9 more
doaj   +1 more source

Optical properties of cubic boron arsenide

, 2019
The ultrahigh thermal conductivity of boron arsenide makes it a promising material for next-generation electronics and optoelectronics. In this work, we report measured optical properties of cubic boron arsenide crystals including the complex dielectric ...
Bushick, Kyle, Chen, Gang, Chen, Ke, Gamage, Geethal Amila, Kioupakis, Emmanouil, Mengle, Kelsey A., Ren, Zhifeng, Song, Bai, Tian, Fei   +8 more
core   +1 more source

In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry [PDF]

, 1997
Using spectroscopic ellipsometry we studied in-situ the growth of off-axis sputtered YBa2Cu3O6+x thin films on (001) SrTiO3 as a function of the deposition parameters. Especially in the very first growth stage (106A cm¿2 @ 77 K) is smooth and homogeneous,
Bijlsma, M.E., Blank, D.H.A., Rogalla, H., Silfhout, A. van, Wormeester, H.   +4 more
core   +3 more sources