Results 31 to 40 of about 78,934 (289)

Co-axial spectroscopic snap-shot ellipsometry for real-time thickness measurements with a small spot size.

Optics Express, 2020
Spectroscopic snap-shot ellipsometry of co-axial structure is proposed to solve the large spot size and long measurement time issues of the conventional ellipsometer. By modulating the spectroscopic ellipsometry signal into high-frequency at the spectral
Seung Woo Lee, Sin Yong Lee, Garam Choi, H. Pahk   +3 more
semanticscholar   +1 more source

Surface and Subsurface Quality Assessment of Polished Lu2O3 Single Crystal Using Quasi-Brewster Angle Technique

Frontiers in Physics, 2021
The sesquioxide Lu2O3 single crystal has attracted tremendous attention as potential host material for high-power solid-state lasers. As polishing is the terminal process of conventional ultra-precision machining, the quality of polished crystal directly
Chengyuan Yao, Wanfu Shen, Wanfu Shen, Xiaodong Hu, Chunguang Hu   +4 more
doaj   +1 more source

Nematic liquid crystal alignment on chemical patterns [PDF]

, 2007
Patterned Self-Assembled Monolayers (SAMs) promoting both homeotropic and planar degenerate alignment of 6CB and 9CB in their nematic phase, were created using microcontact printing of functionalised organothiols on gold films.
Acher O., Alkhairalla B., Alkhairalla B., Atherton T. J., Azzam R. M. A., Barbero G., Barmes F., Bechtold I. H., Berreman D. W., Brown C. V., C. Anquetil, Chen J., Cheng Y. L., Cleaver D. J., D. J. Cleaver, Drawhorn R. D., Gupta V. K., Horne R. G., J. P. Bramble, J. R. Henderson, James R., James R., Jerome B., Jones J. C., Kim J. H., Kim J. H., Kim J.‐H., Kumar A., Kumar S., Lee B.‐W., Lee F. K., Margelevicius M., N. J. Smith, O'Neill M., Padilla P., S. D. Evans, Satiro C., Schadt M., Scharf T., Schubert M., Smith N. J., Varghese S., Wilderbeek T. A., Wohler H., Wohler H., Yeh P., Yoneya M.   +46 more
core   +1 more source

Magneto-Ellipsometry Investigations of Multilayer Nanofilms of Fe and Co [PDF]

Журнал нано- та електронної фізики, 2013
Spectral ellipsometry technique is demonstrated to be a useful tool for the investigation of optical and magneto-optical parameters of magnetic heterostructures. Ellipsometry parameters ψ, Δ were measured in the range of 350-1000 nm.
A.T. Morchenko, L.V. Panina, V.G. Kostishyn, N.A. Yudanov, S.P. Kurochka, A.A. Sergienko, R.D. Piliposyan, N.N. Krupa   +7 more
doaj  

Ellipsometry, transmission, and photoluminescence characterization of Mn-doped ITO thin films deposited by DC magnetron sputtering

Materials Research Express, 2023
Manganese-doped indium tin oxide (ITO) thin films (0–12.8 at% Mn) were deposited by DC magnetron sputtering. The structural, electrical, and optical properties of the films were studied.
Masoud Kaveh, David Lawrence, Scott Bender, Daniel Hirt, William Riffe, Costel Constantin   +5 more
doaj   +1 more source

Dual-comb spectroscopic ellipsometry [PDF]

Nature Communications, 2017
Spectroscopic ellipsometry is a means of investigating optical and dielectric material responses. Conventional spectroscopic ellipsometry is subject to trade-offs between spectral accuracy, resolution, and measurement time.
T. Minamikawa, Y. Hsieh, K. Shibuya, E. Hase, Yoshiki Kaneoka, S. Okubo, H. Inaba, Y. Mizutani, Hirotsugu Yamamoto, T. Iwata, T. Yasui   +10 more
semanticscholar   +1 more source

Data Acquisition of TiO2 for Optical Material by using Spectroscopic Ellipsometry Technique [PDF]

Engineering and Technology Journal, 2010
An Ellipsometric experimental set up of SOPRA ES4G type with a powerfulWVASE software for the theoretical calculus of the Ellipsometry parameters. TheEllipsometry Technique can determine amplitude and phase information Ψ( and Δ)dependent on wavelength ...
Asad Sabih Mohammad Raouf
doaj   +1 more source

The optical properties of transferred graphene and the dielectrics grown on it obtained by ellipsometry

, 2018
Graphene layers grown by chemical vapour deposition (CVD) method and transferred from Cu-foils to the oxidized Si-substrates were investigated by spectroscopic ellipsometry (SE), Raman and X-Ray Photoelectron Spectroscopy (XPS) methods.
Alles, Harry, Kahro, Tauno, Kasikov, Aarne, Kodu, Margus, Matisen, Leonard, Seemen, Helina, Tarre, Aivar   +6 more
core   +1 more source

The Lyddane-Sachs-Teller relationship for polar vibrations in materials with monoclinic and triclinic crystal systems [PDF]

, 2016
A generalization of the Lyddane-Sachs-Teller relation is presented for polar vibrations in materials with monoclinic and triclinic crystal systems. The generalization is derived from an eigen displacement vector summation approach, which is equivalent to
Schubert, Mathias
core   +3 more sources

Reflectivity from electrochemically protected Nb surfaces

Zaštita Materijala, 2015
Corrosion resistance of fine mechanically polished and electro-polished Nb surfaces were tested by elliposmetric measurements the reflectivity at various angle of incidence.
Irena Mickova
doaj   +1 more source