Results 41 to 50 of about 78,934 (289)

Optical properties of cubic boron arsenide

, 2019
The ultrahigh thermal conductivity of boron arsenide makes it a promising material for next-generation electronics and optoelectronics. In this work, we report measured optical properties of cubic boron arsenide crystals including the complex dielectric ...
Bushick, Kyle, Chen, Gang, Chen, Ke, Gamage, Geethal Amila, Kioupakis, Emmanouil, Mengle, Kelsey A., Ren, Zhifeng, Song, Bai, Tian, Fei   +8 more
core   +1 more source

APPLICATION OF THE EFFECTIVE IMPEDANCE METHOD FOR IN SITU ELLIPSOMETRIC ANALYSIS OF MAGNETIC FILMS [PDF]

Физико-химические аспекты изучения кластеров, наноструктур и наноматериалов, 2013
The technique of effective surface impedance is proposed and applied as useful tool for non-destructive in situ characterisation of optical and magneto-optical parameters of magnetic heterostructures.
L.V. Panina, A.T. Morchenko, V.G. Kostishyn, D.N. Chitanov, R.D. Piliposyan   +4 more
doaj  

SYNTHESIS AND INVESTIGATION OF THIN TiO₂ FILMS, DOPED WITH COPPER NANOPARTICLES

Вестник Северо-Кавказского федерального университета, 2022
Thin films of titanium dioxide, doped with copper nanoparticles, were synthesized by the method of deposition on the rotating substrate. The obtained films were dried at room temperature and at temperature of TiO2 calcination and studied by ellipsometry,
Aleksander Kravtsov, Andrej Blinov, Svjatoslav Krandievskij, Elena Momot   +3 more
doaj  

In-situ growth studies of sputtered ybco thin films by spectroscopic ellipsometry [PDF]

, 1997
Using spectroscopic ellipsometry we studied in-situ the growth of off-axis sputtered YBa2Cu3O6+x thin films on (001) SrTiO3 as a function of the deposition parameters. Especially in the very first growth stage (106A cm¿2 @ 77 K) is smooth and homogeneous,
Bijlsma, M.E., Blank, D.H.A., Rogalla, H., Silfhout, A. van, Wormeester, H.   +4 more
core   +3 more sources

Dipole-active optical phonons in YTiO_3: ellipsometry study and lattice-dynamics calculations

, 2008
The anisotropic complex dielectric response was accurately extracted from spectroscopic ellipsometry measurements at phonon frequencies for the three principal crystallographic directions of an orthorhombic (Pbnm) YTiO_3 single crystal.
A. A. Mozhegorov, A. M. Stoneham, A. Maljuk, A. V. Boris, B. Keimer, J. L. Gavartin, K. Parlinski, L. Capogna, Michel Couzi, N. N. Kovaleva, P. Popovich, P. Yordanov   +11 more
core   +1 more source

Ellipsometry and optical spectroscopy of low-dimensional family TMDs

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2017
Here, we report a comprehensive study of fundamental optical properties of two-dimensional materials. These properties have been ascertained using spectroscopic ellipsometry, optical spectroscopy of Raman scattering, and photoluminescence.
V.G. Kravets, V.V. Prorok, L.V. Poperenko, I.A. Shaykevich   +3 more
doaj   +1 more source

Color Engineering of Silicon Nitride Surfaces to Characterize the Polydopamine Refractive Index [PDF]

, 2018
A simple methodology to generate polydopamine (PDA) surfaces featured with color due to thin-film interference phenomena is presented. It is based on depositing ultra-thin films of polydopamine on a Si/Si 3 N 4 wafer that exhibits an interferential ...
Marcelo, Gema, Martín del Valle, Eva M., Pecharromán, Carlos, Perez, Maximiliano Sebastian, Vega Moreno, Milena Amparo   +4 more
core   +1 more source

Temperature Dependent Reflectance and Ellipsometry Studies on a CsPbBr3 Single Crystal

Journal of Physical Chemistry C, 2019
Inorganic halide perovskites have attracted enormous interest in recent years owing to their remarkable properties for next-generation optoelectronics.
Xiaoxuan Chen, Yue Wang, Jizhong Song, Xiaoming Li, Jiayue Xu, H. Zeng, Handong Sun   +6 more
semanticscholar   +1 more source

Stable dielectric response of low-loss aromatic polythiourea thin films on Pt/SiO2 substrate [PDF]

Journal of Advanced Dielectrics, 2016
We have investigated dielectric properties of aromatic polythiourea (ArPTU, a polar polymer containing high dipolar moments with very low defect levels) thin films that were developed on Pt/SiO2 substrate.
A. Eršte, L. Fulanović, L. Čoga, M. Lin, Y. Thakur, Q. M. Zhang, V. Bobnar   +6 more
doaj   +1 more source

On the anomalous optical conductivity dispersion of electrically conducting polymers: ultra-wide spectral range ellipsometry combined with a Drude–Lorentz model

Journal of Materials Chemistry C, 2019
Ultra-wide range spectral range ellipsometry sheds light on the anomalous optical conductivity of conducting polymers.
Shangzhi Chen, P. Kühne, V. Stanishev, S. Knight, Robert Brooke, I. Petsagkourakis, X. Crispin, M. Schubert, V. Darakchieva, M. Jonsson   +9 more
semanticscholar   +1 more source