Results 51 to 60 of about 57,474 (219)

Regime Map of the Effective Medium Approximation Modelling of Micro-Rough Surfaces in Ellipsometry

Sensors
In this work, we discuss the precision of the effective medium approximation (EMA) model in the data analysis of spectroscopic ellipsometry (SE) for solid materials with micro-rough surfaces by drawing the regime map. The SE parameters ψ (amplitude ratio)
Meijiao Huang, Liang Guo, Fengyi Jiang
doaj   +1 more source

Ellipsometry noise spectrum, suspension transfer function measurement and closed-loop control of the suspension system in the Q & A experiment

, 2005
The Q & A experiment, aiming at the detection of vacuum birefringence predicted by quantum electrodynamics, consists mainly of a suspended 3.5 m Fabry-Perot cavity, a rotating permanent dipole magnet and an ellipsometer. The 2.3 T magnet can rotate up to
Anselm A A, Cantatore G, Cantatore G, Chen S-J, Chen S-J, Euler E, Heinzel G, Hsien-Hao Mei, Jacob D, Mei H-H, Morrison E, Nezrick F, Ni W-T, Ni W-T, Ni W-T, Pengo R, Rizzo C, Sheng-Jui Chen, Wei-Tou Ni, Wu J-S   +19 more
core   +1 more source

Apparatus and methods for measuring of the film structures homogeneity degree [PDF]

Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, 2009
The designer-technological analysis of ellipsometric parameters measuring and calculation of the film refraction index and thickness scheme is conducted in this article. The flow-chart is developed and the model of apparatus for the film refraction index
Makara V. A., Odarych V. A., Kepich T. Y., Preobragenskaya T. D., Rudenko O. V.   +4 more
doaj  

Magnetoresistance Effects in SrFeO(3-x): Dependence on Phase Composition and Relation to Magnetic and Charge Order

, 2005
Single crystals of iron(IV) rich oxides SrFeO(3-x) with controlled oxygen content have been studied by Moessbauer spectroscopy, magnetometry, magnetotransport measurements, Raman spectroscopy, and infrared ellipsometry in order to relate the large ...
A. Lebon, A. Maljuk, A. V. Boris, B. Keimer, C. Bernhard, C. Bernhard, C. T. Lin, C. Ulrich, H. Oda, P. Adler, T. Takeda, V. Damljanović   +11 more
core   +2 more sources

Interactions between Cetyltrimethylammonium Bromide Modified Cellulose Nanocrystals and Surfaces: An Ellipsometric Study

Surfaces
The tailoring of the surface properties of cellulose nanocrystals (CNCs) to meet various requirements in environmental, food, and material areas has always been of great interest. In this study, the surface chemistry of CNCs was noncovalently modified by
Xiaoyu Gong, Md Farhad Ismail, Yaman Boluk   +2 more
doaj   +1 more source

Electron transport through rectifying self-assembled monolayer diodes on silicon: Fermi level pinning at the molecule-metal interface

, 2006
We report the synthesis and characterization of molecular rectifying diodes on silicon using sequential grafting of self-assembled monolayers of alkyl chains bearing a pi group at their outer end (Si/sigma-pi/metal junctions).
Bouloussa, O., Bourgoin, J. P., Chevrot, C., Guerin, D., Lenfant, S., Palacin, S., Rondelez, F., Van, F. Tran, Vuillaume, D.   +8 more
core   +4 more sources

Extreme Ultraviolet Stokesmeter for Pulsed Magneto-Optics

Photonics, 2015
Several applications in material science and magnetic holography using extreme ultraviolet (EUV) radiation require the measurement of the degree and state of polarization.
Mabel Ruiz-Lopez, Francesco Barbato, Yasin Ekinci, Davide Bleiner   +3 more
doaj   +1 more source

Electron effective mass in Al$_{0.72}$Ga$_{0.28}$N alloys determined by mid-infrared optical Hall effect

, 2013
The effective electron mass parameter in Si-doped Al$_{0.72}$Ga$_{0.28}$N is determined to be $m^\ast=(0.336\pm0.020)\,m_0$ from mid-infrared optical Hall effect measurements.
A. Kakanakova-Georgieva, D. Nilsson, E. Janzén, M. Schubert, P. Kühne, Pidgeon C., S. Schöche, Schubert M., T. Hofmann, V. Darakchieva   +9 more
core   +2 more sources

Mid-Infrared (MIR) Complex Refractive Index Spectra of Polycrystalline Copper-Nitride Films by IR-VASE Ellipsometry and Their FIB-SEM Porosity [PDF]

, 2023
E. Márquez, E. Blanco, José Mánuel, Manuel Ballester, Marcos García-Gurrea, M.I. Rodríguez-Tapiador, S. Fernández, Florian Willomitzer, Aggelos K. Katsaggelos   +8 more
openalex   +1 more source

Optical properties of graphene film growing on a thin copper layer

Semiconductor Physics, Quantum Electronics & Optoelectronics, 2016
Optical properties and surface structure of graphene films grown on thin 1-μm copper layer using the chemical vapor deposition method were investigated applying spectroscopic ellipsometry and nanoscopic measurements.
T.S. Rozouvan
doaj   +1 more source