Results 21 to 30 of about 2,049,776 (246)

Transient Analysis of ESD Protection Circuits for High-Speed ICs

open access: yesIEEE transactions on electromagnetic compatibility (Print), 2021
Electrostatic discharge (ESD) failures in high-speed integrated circuits (ICs) cause critical reliability problems in electronic devices. Transient voltage suppressor (TVS) diodes are installed on high-speed I/O traces to improve system-level ESD ...
J. Meiguni   +10 more
semanticscholar   +1 more source

Polyglycolic Acid Sheet Application to Refractory Delayed Bleeding After Rectal Endoscopic Submucosal Dissection: A Case Report. [PDF]

open access: yesDEN Open
ABSTRACT A man in his 50s underwent endoscopic submucosal dissection (ESD) for a rectal tumor measuring 28 mm. He was not taking any antithrombotic medication. On the third, 11th, 18th, and 24th days after the procedure, bleeding was observed from different areas of the ulcer bed margin and was managed with hemostatic forceps.
Nakano Y   +3 more
europepmc   +2 more sources

A Study of ESD-mmWave-Switch Co-Design of 28GHz Distributed Travelling Wave Switch in 22nm FDSOI for 5G Systems

open access: yesIEEE Journal of the Electron Devices Society, 2021
This paper presents the first co-design analysis of 28GHz broadband single-pole double-throw (SPDT) distributed travelling wave RF switches implemented in a foundry 22nm fully-depleted silicon-on-insulator (FDSOI) CMOS technology, featuring 9KV full-chip
Mengfu Di   +5 more
doaj   +1 more source

3D TCAD Analysis Enabling ESD Layout Design Optimization

open access: yesIEEE Journal of the Electron Devices Society, 2020
On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan   +4 more
doaj   +1 more source

Design of LDO Regulator With High Reliability ESD Protection Circuit Using Analog Current Switch Structure for 5-V Applications

open access: yesIEEE Access, 2023
The modern electronic device should be able to provide stable voltage and current under a variety of conditions. The LDO regulator used in the electronic device is a system that requires various voltages and load currents.
Sang-Wook Kwon, Yong-Seo Koo
doaj   +1 more source

An Equivalent Circuit Model of a Commercial LED With an ESD Protection Component for VLC

open access: yesIEEE Photonics Technology Letters, 2021
An equivalent circuit model for a typical commercial light-emitting diode (LED) used in visible light communication (VLC) applications is proposed. The parameters of the elements in the model are extracted from the measured impedance using a vector ...
Xicong Li   +3 more
semanticscholar   +1 more source

Microplastics in the menu of Mediterranean zooplankton: Insights from the feeding response of the calanoid copepod Centropages typicus

open access: yesMarine Ecology, EarlyView., 2023
Abstract Microplastic input into the ocean represents an increasing threat to marine biota and may endanger the functioning of marine ecosystems, especially in semi‐enclosed basins, such as the Mediterranean Sea. The size spectrum of microplastics overlaps with that of nano‐microplankton (2–200 μm), thus potentially misleading suspension‐feeding ...
Claudia Traboni   +3 more
wiley   +1 more source

Investigating Graphene gNEMS ESD Switch for Design Optimization

open access: yesIEEE Journal of the Electron Devices Society, 2021
Traditional in-Silicon PN-junction-based on-chip electrostatic discharge (ESD) protection structures have inherent ESD-induced design overhead problems, including parasitic capacitance, leakage and Si area consumption.
Cheng Li   +5 more
doaj   +1 more source

A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS

open access: yesIEEE Access, 2020
Transient voltage peaking under very fast electrostatic discharge (ESD), like charged device model (CDM) pulse, is a serious problem to integrated circuits (ICs).
Chenkun Wang   +5 more
doaj   +1 more source

Enhance the ESD Ability of UHV 300-V Circular LDMOS Components by Embedded SCRs and the Robustness P-Body Well

open access: yesIEEE Journal of the Electron Devices Society, 2021
The ultra-high voltage (UHV) Lateral-diffused MOSFET (LDMOS) transistor has been widely used in power circuit applications and also used as an electrostatic discharge (ESD) self-protection device.
Po-Lin Lin, Shen-Li Chen, Sheng-Kai Fan
doaj   +1 more source

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