Results 1 to 10 of about 2,524 (188)

Graphene-Based ESD Protection for Future ICs [PDF]

open access: yesNanomaterials, 2023
On-chip electrostatic discharge (ESD) protection is required for all integrated circuits (ICs). Conventional on-chip ESD protection relies on in-Si PN junction-based device structures for ESD.
Cheng Li   +5 more
doaj   +4 more sources

Study on ESD Protection Circuit by TCAD Simulation and TLP Experiment [PDF]

open access: yesMicromachines, 2023
The anti-ESD characteristic of the electronic system is paid more and more attention. Moreover, the on-chip electrostatic discharge (ESD) is necessary for integrated circuits to prevent ESD failures.
Fuxing Li   +5 more
doaj   +2 more sources

A Novel Bidirectional AlGaN/GaN ESD Protection Diode [PDF]

open access: yesMicromachines, 2022
Despite the superior working properties, GaN-based HEMTs and systems are still confronted with the threat of a transient ESD event, especially for the vulnerable gate structure of the p-GaN or MOS HEMTs.
Bin Yao   +11 more
doaj   +2 more sources

A Novel DTSCR Structure with High Holding Voltage and Enhanced Current Discharge Capability for 28 nm CMOS Technology ESD Protection [PDF]

open access: yesMicromachines, 2023
To cope with the much narrower ESD design window in 28 nm CMOS technology, a novel diode-triggered silicon-controlled rectifier with an extra discharge path (EDP-DTSCR) for ESD protection is proposed in this paper.
Zeen Han   +6 more
doaj   +2 more sources

Improving ESD Protection Robustness Using SiGe Source/Drain Regions in Tunnel FET [PDF]

open access: yesMicromachines, 2018
Currently, a tunnel field-effect transistor (TFET) is being considered as a suitable electrostatic discharge (ESD) protection device in advanced technology.
Zhaonian Yang   +3 more
doaj   +2 more sources

The ESD Robustness and Protection Technology of P-GaN HEMT [PDF]

open access: yesMicromachines
This work first analyzes the failure behaviors of P-GaN HEMTs with different gate structures (Schottky gate vs. Ohmic gate) under both forward and reverse ESD stresses.
Yijun Shi   +5 more
doaj   +2 more sources

Interposer-Based ESD Protection: A Potential Solution for μ-Packaging Reliability of 3D Chips [PDF]

open access: yesMicromachines
The ending of Moore’s Law calls for innovations in integrated circuit (IC) technologies and chip designs. Heterogeneous integration (HI) emerges as a pathway towards smart future chips for more Moore time and for beyond-Moore time, featuring systems-on ...
Xunyu Li   +5 more
doaj   +2 more sources

SCR-Based ESD Protection Using a Penta-Well for 5 V Applications

open access: yesIEEE Journal of the Electron Devices Society, 2018
This paper proposes a new structure of silicon controlled rectifier (SCR)-based ESD protection circuit using a penta-well for ESD protection in 5 V applications. The proposed circuit exhibits higher holding voltage and current-driving capability than low
Bo-Bae Song, Kyoung-Il Do, Yong-Seo Koo
doaj   +3 more sources

1 fF ESD protection device for gigahertz high-frequency output ESD protection

open access: yesElectronics Letters, 2011
A mutual-protection scheme is proposed to achieve an ultra-low capacitance electrostatic discharge (ESD) protection device. The ESD protection device can not only dissipate ESD current, but also can make the vulnerable output transistor have the ESD protection capability.
S -C Huang, Y -H Wu
exaly   +2 more sources

Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network

open access: yesCrystals, 2021
The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network.
Zhihua Zhu   +5 more
doaj   +1 more source

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