Results 301 to 303 of about 311,379 (303)
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The effect of resistive open faults on SRAM

AIP Conference Proceedings
C. Gangaiah Yadav   +5 more
openaire   +1 more source

Efficient Delay Fault Characterization of Resistive Open Defects in Standard Cells Using Resistive Fault Dominance

2025 IEEE International Test Conference (ITC)
Gowsika Dharmaraj   +3 more
openaire   +1 more source

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