Results 211 to 220 of about 889 (227)

In-Depth Understanding of Nitridation-Induced Endurance Enhancement in FeFETs: Defect Properties and Dynamics Characterized by Nonradiative Multi-Phonon Model

IEEE Transactions on Electron Devices
Jun-Shuai Chai, Xiaolei Wang, Qing Luo   +2 more
exaly  

FeFET based pipeline-style logic-in-memory circuits

Microelectronics Journal
Yang Li, Zhaohui Yang, Lunyao Wang, Zhichao Dong 0003, Yuqiang Hu, Qianhuo Wu, Yinshui Xia, Xiaojing Zha   +7 more
openaire   +2 more sources

Multi-Grain Ferroelectric Induced Drain Current Variability in BEOL-Compatible OS FeFETs

IEEE Electron Device Letters
Xuanyao Fong, Ye Lu, Xiao Gong
exaly  

FeMPIM: A FeFET-Based Multifunctional Processing-in-Memory Cell

IEEE Transactions on Circuits and Systems II: Express Briefs
Aibin Yan, Yu Chen, Zhongyu Gao, Tianming Ni, Zhengfeng Huang, Jie Cui 0004, Patrick Girard 0001, Xiaoqing Wen   +7 more
openaire   +1 more source

Understanding Bias Stress-Induced Instabilities in ALD-Deposited ZnO FeFETs Featuring HZO-Al2O3-HZO Ferroelectric Stack

IEEE Electron Device Letters
Haiwen Xu, Xiao Gong, Zhang Dong
exaly  

FeFET Devices, Trends, Technology and Applications

openaire   +1 more source

RelHDx: Hyperdimensional Computing for Learning on Graphs With FeFET Acceleration

IEEE Transactions on Computers
Jaeyoung Kang 0001, Minxuan Zhou, Weihong Xu, Tajana Rosing   +3 more
openaire   +1 more source

Tuning Polarity in WSe2/AlScN FeFETs via Contact Engineering

ACS Nano
Shalini Kumari, Pariasadat Musavigharavi, Eric Stach   +2 more
exaly  

Study on the Anomalous Characteristics of Random Telegraph Noise in FeFETs

Runsheng Wang, Zixuan Sun
exaly  

Optimized MFS Stack With N-Doped TiO2 Channel and La-Doped HfO2 Ferroelectric Layer for Highly Stable FeFETs

IEEE Electron Device Letters
Jinfeng Kang, Xujin Song
exaly