Results 131 to 140 of about 11,359 (209)

Enhanced Drive Current in 10 nm Channel Length Gate-All-Around Field-Effect Transistor Using Ultrathin Strained Si/SiGe Channel. [PDF]

Micromachines (Basel)
Yugender P, Dhar RS, Nanda S, Kumar K, Sakthivel P, Thirumurugan A.   +5 more
europepmc   +1 more source

Development and Performance Analysis of High-K Spacer-Induced Strained Si/SiGe Channel-Based Gate All Around FET for Thermal Effects. [PDF]

Nanomaterials (Basel)
Yugender P, Singh S, Kumar K, Dhar RS, Seteikin AY, Banerjee A, Samusev IG.   +6 more
europepmc   +1 more source

Remarkably High Effective Mobility of 301 cm²/V·s in 3 nm Ultra-Thin-Body SnO₂ Transistor by UV Annealing. [PDF]

Nanomaterials (Basel)
Shih AC, Zhan YH, Chin A.
europepmc   +1 more source

An Overview of Hot Carrier Degradation on Gate-All-Around Nanosheet Transistors. [PDF]

Micromachines (Basel)
Zhou H.
europepmc   +1 more source

Epitaxial Mixed-Dimensional MoS₂ Nanofin-Nanoribbon Hybrids and Their Integration into Electronic and Optoelectronic Devices. [PDF]

ACS Appl Mater Interfaces
Danieli Y, Houben L, Rechav K, Brontvein O, Kaplan-Ashiri I, Pinkas I, Vilan A, Joselevich E.   +7 more
europepmc   +1 more source

Effect of C₂H₂F₄/CF₄O with low global warming potentials on SiN_x etching as a CHF₃ replacement. [PDF]

Sci Rep
Kim KL, Hong JW, Jeon YW, Jeong JW, Kim CH, Eoh HJ, Kim SH, Park JS, Cho NI, Kwak JH, Kim Y, Yeom GY.   +11 more
europepmc   +1 more source

Comparing the Performance of FinFET SoI and FinFET Bulk

Scinzer Journal of Engineering, 2016
openaire   +1 more source

FinFET Device Simulation and NAND Gate Implementation using DG FinFET

Communications on Applied Electronics, 2016
Bhavesh H., Kruti B.
openaire   +1 more source

Sub-THz communication systems: pushing the capabilities of silicon. [PDF]

Commun Eng
Gruber J, Alotaibi H, Tabatabavakili A, Chen L, Aghasi H, Naghavi SMH, Afshari E.   +6 more
europepmc   +1 more source

Degradation Induced by Total Ionizing Dose and Hot Carrier Injection in SOI FinFET Devices. [PDF]

Micromachines (Basel)
Yu H, Zhou W, Liu H, Wang S, Chen S, Liu C.   +5 more
europepmc   +1 more source