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Reliability of Solid-State Drives Based on NAND Flash Memory
Proceedings of the IEEE, 2017Neal R. Mielke +5 more
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A 512Gb 3b/Cell 3D flash memory on a 96-word-line-layer technology
IEEE International Solid-State Circuits Conference, 2018H. Maejima +63 more
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Evolution of NAND Flash Memory: From 2D to 3D as a Storage Market Leader
International Memory Workshop, 2017Hyunsuk Kim +4 more
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2005 IEEE International Integrated Reliability Workshop, 2006
A. Modelli, A. Visconti
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A. Modelli, A. Visconti
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True Random Number Generation Using Read Noise of Flash Memory Cells
IEEE Transactions on Electron Devices, 2018B. Ray, A. Milenković
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Non‐Volatile Silicon Photonics Using Nanoscale Flash Memory Technology
, 2018M. Grajower +3 more
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