Results 11 to 20 of about 108,927 (272)

Long-Term Performance of Magnetic Force Microscopy Tips Grown by Focused Electron Beam Induced Deposition. [PDF]

Sensors (Basel), 2023
High-resolution micro- and nanostructures can be grown using Focused Electron Beam Induced Deposition (FEBID), a direct-write, resist-free nanolithography technology which allows additive patterning, typically with sub-100 nm lateral resolution, and down
Escalante-Quiceno AT, Novotný O, Neuman J, Magén C, De Teresa JM.   +4 more
europepmc   +4 more sources

Electron-Induced Decomposition of Different Silver(I) Complexes: Implications for the Design of Precursors for Focused Electron Beam Induced Deposition. [PDF]

Nanomaterials (Basel), 2022
Focused electron beam induced deposition (FEBID) is a versatile tool to produce nanostructures through electron-induced decomposition of metal-containing precursor molecules. However, the metal content of the resulting materials is often low.
Martinović P, Rohdenburg M, Butrymowicz A, Sarigül S, Huth P, Denecke R, Szymańska IB, Swiderek P.   +7 more
europepmc   +4 more sources

The rational design of a Au(I) precursor for focused electron beam induced deposition. [PDF]

Beilstein J Nanotechnol, 2017
Au(I) complexes are studied as precursors for focused electron beam induced processing (FEBIP). FEBIP is an advanced direct-write technique for nanometer-scale chemical synthesis.
Marashdeh A, Tiesma T, van Velzen NJC, Harder S, Havenith RWA, De Hosson JTM, van Dorp WF.   +6 more
europepmc   +4 more sources

Synthesis of [{AgO₂CCH₂OMe(PPh₃)} _n ] and theoretical study of its use in focused electron beam induced deposition. [PDF]

Beilstein J Nanotechnol, 2017
The synthesis, chemical and physical properties of [{AgO2CCH2OMe}n] (1) and [{AgO2CCH2OMe(PPh3)}n] (2) are reported. Consecutive reaction of AgNO3 with HO2CCH2OMe gave 1, which upon treatment with PPh3 produced 2.
Tamuliene J, Noll J, Frenzel P, Rüffer T, Jakob A, Walfort B, Lang H.   +6 more
europepmc   +4 more sources

Multiscale simulation of the focused electron beam induced deposition process. [PDF]

Sci Rep, 2020
AbstractFocused electron beam induced deposition (FEBID) is a powerful technique for 3D-printing of complex nanodevices. However, for resolutions below 10 nm, it struggles to control size, morphology and composition of the structures, due to a lack of molecular-level understanding of the underlying irradiation-driven chemistry (IDC).
de Vera P, Azzolini M, Sushko G, Abril I, Garcia-Molina R, Dapor M, Solov'yov IA, Solov'yov AV.   +7 more
europepmc   +9 more sources

Continuum models of focused electron beam induced processing [PDF]

Beilstein Journal of Nanotechnology, 2015
Focused electron beam induced processing (FEBIP) is a suite of direct-write, high resolution techniques that enable fabrication and editing of nanostructured materials inside scanning electron microscopes and other focused electron beam (FEB) systems ...
Milos Toth, Charlene Lobo, Vinzenz Friedli, Aleksandra Szkudlarek, Ivo Utke   +4 more
doaj   +3 more sources

Electron interactions with the heteronuclear carbonyl precursor H₂FeRu₃(CO)₁₃ and comparison with HFeCo₃(CO)₁₂: from fundamental gas phase and surface science studies to focused electron beam induced deposition. [PDF]

Beilstein J Nanotechnol, 2018
In the current contribution we present a comprehensive study on the heteronuclear carbonyl complex H2FeRu3(CO)13 covering its low energy electron induced fragmentation in the gas phase through dissociative electron attachment (DEA) and dissociative ...
P RKT, Weirich P, Hrachowina L, Hanefeld M, Bjornsson R, Hrodmarsson HR, Barth S, Fairbrother DH, Huth M, Ingólfsson O.   +9 more
europepmc   +4 more sources

Low-energy electron interaction and focused electron beam-induced deposition of molybdenum hexacarbonyl (Mo(CO)₆). [PDF]

Beilstein J Nanotechnol, 2022
Motivated by the potential role of molybdenum in semiconductor materials, we present a combined theoretical and experimental gas-phase study on dissociative electron attachment (DEA) and dissociative ionization (DI) of Mo(CO)6 in comparison to focused ...
Shih PY, Cipriani M, Hermanns CF, Oster J, Edinger K, Gölzhäuser A, Ingólfsson O.   +6 more
europepmc   +2 more sources

Superconducting single-photon detectors fabricated via a focused electron beam-induced deposition process [PDF]

AIP Advances, 2023
Superconducting detectors have become essential devices for high-performance single-photon counting over a wide wavelength range with excellent time resolution.
Stephan Steinhauer, Adrian Iovan, Samuel Gyger, Val Zwiller   +3 more
doaj   +2 more sources

Temperature-Dependent Growth Characteristics of Nb- and CoFe-Based Nanostructures by Direct-Write Using Focused Electron Beam-Induced Deposition. [PDF]

Micromachines (Basel), 2019
Focused electron and ion beam-induced deposition (FEBID/FIBID) are direct-write techniques with particular advantages in three-dimensional (3D) fabrication of ferromagnetic or superconducting nanostructures.
Huth M, Porrati F, Gruszka P, Barth S.
europepmc   +2 more sources