Results 241 to 250 of about 1,056,535 (282)
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p-Channel GaN Transistor Based on p-GaN/AlGaN/GaN on Si
IEEE Electron Device Letters, 2019In this letter, we demonstrate a recessed-gate p-channel MISFET using a p-GaN (70 nm)/Al 0.2Ga0.8N (15 nm)/GaN heterostructure grown by metalorganic chemical vapor deposition (MOCVD) on a Si substrate. A major benefit of such epi-structure is that it contains both a 2-dimensional electron gas (2-DEG) and a 2-dimensional hole gas (2-DHG), hence making ...
Chowdhury, Nadim +10 more
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Electrochemical lift-off of GaN films for GaN-on-GaN technology
Journal of Physics D: Applied Physics, 2023Abstract Lifting off the native GaN substrate is an essential step in the fabrication of high-performance devices. In this study, we report a method to separate GaN thin films from GaN substrate through electrochemical (EC) lateral etching.
Yuzhen Liu +9 more
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Single-crystal GaN/Gd2O3/GaN heterostructure
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2002Heteroepitaxy of single-crystal Gd2O3 on GaN (with a wurtzite hexagonal close-packed (hcp) structure) and single-crystal GaN on Gd2O3 was achieved. In situ reflection high-energy electron diffraction reveals a sixfold symmetry in the in-plane epitaxy of the rare earth oxide on GaN and also in the overgrowth of GaN on the oxide.
M. Hong +9 more
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Fabrication of GaN/Alumina/GaN Structure to Reduce Dislocations in GaN
Japanese Journal of Applied Physics, 2003GaN/Alumina/GaN structures were fabricated to reduce dislocation density in GaN. Alumina films were deposited on GaN templates by electron cyclotron resonance plasma sputtering. GaN was regrown on the alumina films by metalorganic vapor phase epitaxy.
Masanobu Hiroki +4 more
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High barrier height GaN Schottky diodes: Pt/GaN and Pd/GaN
Applied Physics Letters, 1996Platinum (Pt) and palladium (Pd) Schottky diodes on n-type GaN grown by metalorganic chemical vapor deposition were achieved and investigated. Aluminum was used for ohmic contacts. Barrier heights were determined to be as high as ΦB=1.13 eV by the current–voltage (I–V) method and ΦB=1.27 eV by the capacitance–voltage (C–V) method for the Pt/GaN diode ...
Lei Wang +4 more
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Microwave journal Internation. ed., 2014
Engineers in the defense community have long sought to replace the bulky and heavy traveling wave tubes (TWT) used in high power systems such as radar, communications satellite and electronic warfare (EW) with compact, lightweight, cheaper and more efficient semiconductor components. Diamond is also an excellent electrical insulator - a property needed
Ejeckam, F. +9 more
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Engineers in the defense community have long sought to replace the bulky and heavy traveling wave tubes (TWT) used in high power systems such as radar, communications satellite and electronic warfare (EW) with compact, lightweight, cheaper and more efficient semiconductor components. Diamond is also an excellent electrical insulator - a property needed
Ejeckam, F. +9 more
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GaN Growth Using GaN Buffer Layer
Japanese Journal of Applied Physics, 1991High-quality gallium nitride (GaN) film was obtained for the first time using a GaN buffer layer on a sapphire substrate. An optically flat and smooth surface was obtained over a two-inch sapphire substrate. Hall measurement was performed on GaN films grown with a GaN buffer layer as a function of the thickness of the GaN buffer layer. For the GaN
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