Results 11 to 20 of about 2,632,024 (290)

Measurement error in geometric morphometrics

open access: yesDevelopment Genes and Evolution, 2016
Geometric morphometrics-a set of methods for the statistical analysis of shape once saluted as a revolutionary advancement in the analysis of morphology -is now mature and routinely used in ecology and evolution. However, a factor often disregarded in empirical studies is the presence and the extent of measurement error.
Fruciano, Carmelo, Fruciano C.
openaire   +5 more sources

The geometric error for homographies [PDF]

open access: yesComputer Vision and Image Understanding, 2005
We address the problem of finding optimal point correspondences between images related by a homography: given a homography and a pair of matching points, determine a pair of points that are exactly consistent with the homography and that minimize the geometric distance to the given points.
Ondrej Chum   +2 more
openaire   +4 more sources

On Geometric Error for Homographies [PDF]

open access: yes, 2003
We address the problem of finding optimal point correspondences between images related by an homography: given an homography and a pair of matching points, determine a pair of points that are exactly consistent with the homography and that minimize the geometric distance to the given points.
Chum, Ondra   +2 more
core   +4 more sources

Comparison of Volumetric Analysis Methods for Machine Tools with Rotary Axes [PDF]

open access: yes, 2009
Confidence in the ability of a production machine to meet manufacturing tolerances requires a full understanding of the accuracy of the machine. However, the definition of “the accuracy of the machine” is open to interpretation. Historically, this has
Longstaff, Andrew P.   +3 more
core   +11 more sources

Geometric View of Measurement Errors [PDF]

open access: yesCommunications in Statistics - Simulation and Computation, 2011
The slope of the best fit line from minimizing the sum of the squared oblique errors is the root of a polynomial of degree four. This geometric view of measurement errors is used to give insight into the performance of various slope estimators for the measurement error model including an adjusted fourth moment estimator introduced by Gillard and Iles ...
Diarmuid O'driscoll, Donald E. Ramirez
openaire   +3 more sources

Error Correction and Detection, a Geometric Approach [PDF]

open access: yesThe Computer Journal, 1984
Summary: This paper is basically a tutorial on error detection and correction. The presentation though is via a new approach. This approach has an inherent characteristic leading to parallel hardware implementation and is thus better suited for computer and parallel processing applications.
Rabab K. Ward, M. Tabandeh
openaire   +3 more sources

Geometric continuous patch complexes [PDF]

open access: yes, 1987
A theory of geometric continuity of arbitrary order is presented. Conditions of geometric continuity at a vertex where a number of patches meet are investigated.
Hahn, JM
core   +4 more sources

Predicting geometric errors and failures in additive manufacturing

open access: yesRapid Prototyping Journal, 2023
Purpose Objects fabricated using additive manufacturing (AM) technologies often suffer from dimensional accuracy issues and other part-specific problems. This study aims to present a framework for estimating the printability of a computer-aided design (CAD) model that expresses the probability that the model is fabricated correctly via an AM ...
Ioannis Fudos   +3 more
openaire   +2 more sources

Geometric Error Parameterization of a CMM via Calibrated Hole Plate Archived Utilizing DCC Formatting

open access: yesApplied Sciences, 2023
This study implemented the measurement results and administrative information obtained from the hole plate into the Digital Calibration Certificate (DCC).
Ming-Xian Lin, Tsung-Han Hsieh
doaj   +1 more source

Ultraprecision Real-Time Displacements Calculation Algorithm for the Grating Interferometer System

open access: yesSensors, 2019
Grating interferometry is an environmentally stable displacement measurement technique that has significant potential for identifying the position of the wafer stage.
Weinan Ye   +6 more
doaj   +1 more source

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