Results 1 to 10 of about 3,083 (223)

As-deposited ferroelectric HZO on a III–V semiconductor [PDF]

open access: yesApplied Physics Letters, 2022
By electrical characterization of thin films deposited by atomic layer deposition, HfxZr1−xO2 (HZO) is shown to be ferroelectric as-deposited, i.e., without any annealing step, using a thermal budget of 300 °C.
Andersen, André   +5 more
core   +3 more sources

Study of structural and electrical properties of ferroelectric HZO films obtained by single-target sputtering

open access: yesAIP Advances, 2021
In this work, we study the structural and electrical properties of Hafnium Zirconium Oxide (HZO) thin films deposited by Hf0.5Zr0.5O2 single-target sputtering to fabricate a TiN/(14-/22 nm-thick) HZO/TiN stack.
M. B. Hachemi   +8 more
doaj   +2 more sources

Polarization Switching Kinetics in Thin Ferroelectric HZO Films

open access: yesNanomaterials, 2022
Ferroelectric polycrystalline HfO2 thin films are the most promising material for the implementation of novel non-volatile ferroelectric memories because of their attractive properties, such as compatibility with modern Si technology, perfect scalability,
Anastasia Chouprik   +3 more
core   +4 more sources

On the Reliability of HZO-Based Ferroelectric Capacitors: The Cases of Ru and TiN Electrodes

open access: yesNanomaterials, 2022
Despite the great potential of Hf0.5Zr0.5O2 (HZO) ferroelectrics, reliability issues, such as wake-up, fatigue, endurance limitations, imprint and retention loss, impede the implementation of HZO to nonvolatile memory devices.
Khakimov, Roman R.   +7 more
core   +4 more sources

A Comparative Study of n- and p-Channel FeFETs with Ferroelectric HZO Gate Dielectric

open access: yesSolids, 2023
This study investigates the electrical characteristics observed in n-channel and p-channel ferroelectric field effect transistor (FeFET) devices fabricated through a similar process flow with 10 nm of ferroelectric hafnium zirconium oxide (HZO) as the ...
Paul Jacob, Shan Deng, Kai Ni
exaly   +2 more sources

Effect of bottom electrodes on HZO thin film properties

open access: yes, 2021
International audienceThe discovery of memristor, theorized in 1971 by L. Chua, has led to the development of novel artificial neuromorphic concepts and devices, including ferroelectric-based ones.
Segantini, Greta   +7 more
core   +4 more sources

Reduced annealing temperature for ferroelectric HZO on InAs with enhanced polarization [PDF]

open access: yesApplied Physics Letters, 2020
Deposition, annealing, and integration of ferroelectric Hf x Zr 1 - x O 2 (HZO) thin films on the high-mobility semiconductor InAs using atomic layer deposition are investigated.
Robin Athle   +21 more
core   +2 more sources

Reducing Coercive Field and Improving Endurance in Ferroelectric Epitaxial Hf0.5Zr0.5O2 Thin Films via Novel Interface Layer Approach [PDF]

open access: yesAdvanced Science
Ferroelectric doped hafnium oxide (HfO2) has emerged as CMOS‐compatible and scalable ferroelectric for next‐generation memory/in‐memory computing devices. However, its high coercive field (Ec) and limited endurance remain key obstacles.
Ji Soo Kim   +9 more
doaj   +2 more sources

Associative Learning Emulation in HZO-Based Ferroelectric Memristor Devices

open access: yesMaterials
Neuromorphic computing inspired by biological synapses requires memory devices capable of mimicking short-term memory (STM) and associative learning. In this study, we investigate a 15 nm-thick Hafnium zirconium oxide (HZO)-based ferroelectric memristor ...
Sungjun Kim, Euncho Seo, Maria Rasheed
core   +3 more sources

Study of Imprint Dynamics in HZO Ferroelectric Capacitors

open access: yes, 2023
International audienceThe discovery of the ferroelectric orthorhombic phase in doped HfO2 gave a major boost to the interest for integrated ferroelectric oxides in the CMOS industry [1].
Segantini, Greta   +6 more
core   +3 more sources

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