Quantum noise spectroscopy of nanoscale charge defects in silicon carbide at room temperature. [PDF]
Liu J +13 more
europepmc +1 more source
Diketopyrrolopyrrole‐Based Cation as a Semiconducting Spacer in Layered Perovskite
Diketopyrrolopyrrole cation incorporated layered perovskites exhibiting extended absorption profiles and enhanced charge carrier mobility with type‐II energy alignment. The improved photoconversion efficiency demonstrates the critical role of incorporating organic semiconductors in optimizing layered perovskite performance.
Waygen Thor +8 more
wiley +1 more source
Reversible Thickness Engineering in Amorphous In<sub>2</sub>O<sub>3</sub> Transistors. [PDF]
Pan YY +8 more
europepmc +1 more source
Defect‐Templated Phase Engineering in Atomically Thin Metals
Graphene defects are transformed from passive imperfections into programmable templates for phase‐selective growth of atomically thin silver. Plasma‐generated boundary defects favor Ag(1), whereas sp3‐rich zero‐layer graphene promotes Ag(2). This defect‐directed intercalation links local graphene chemistry to crystalline phase, electronic structure ...
Arpit Jain +25 more
wiley +1 more source
Basic Notions and Innovations in Electrochemical Advanced Oxidation Processes for Water Treatment. [PDF]
Tanos F +11 more
europepmc +1 more source
Crystal orientation and domain engineering enable bulk mirror symmetry breaking in Bi1−xSbx, resulting in ultralow current‐induced switching of perpendicular magnetization without an external field. By exploiting single‐domain Bi1−xSbx (012), the authors demonstrate an out‐of‐plane spin Hall conductivity of ∼1.12×105ℏ2eΩ−1m−1$ \sim \!1.12 \ensuremath ...
Seungwon Rho +6 more
wiley +1 more source
Broadly applicable hydrophilic additive enhances electrochemical transistor function. [PDF]
Gao L +19 more
europepmc +1 more source
PtSe<sub>2</sub>-Based Heterostructures on GaP Nanowires: Interface Formation and Photoelectrical Properties. [PDF]
Laurenčíková A +12 more
europepmc +1 more source
Comparison of Quantum Transition Characteristics of Group II-VI (ZnO), Group III-V (GaN) Compound Semiconductors, and Intrinsic (Si) Semiconductors in Response to Externally Applied Energy. [PDF]
Park H, Lee SH.
europepmc +1 more source
Advanced physical modeling approaches for high-precision TCAD simulation of GaN HEMT power devices: a review. [PDF]
Zhao H +6 more
europepmc +1 more source

