Results 101 to 110 of about 9,808,693 (352)

Electron impact ionization and fragmentation of biofuels [PDF]

open access: yes, 2019
We present in this article, a review of our recent experimental and theoretical studies published in the literature on electron impact ionization and fragmentation of the primary alcohols methanol, ethanol, 1-propanol and 1-butanol (C1–C4).
Brunger, Michael J.   +46 more
core   +1 more source

Designing Polymer Nanocomposites for X‐Ray Shielding: Mechanisms, Architectures, and Scalable Processing

open access: yesAdvanced Engineering Materials, EarlyView.
This review highlights advances in lightweight, lead‐free polymer nanocomposites for diagnostic X‐ray shielding. By linking filler chemistry, dispersion, architecture, and photon interaction mechanisms, it establishes structure–performance relationships guiding material design.
Aklilu G. Messele   +2 more
wiley   +1 more source

On Temperature Dependency of Steep Subthreshold Slope in Dual-Independent-Gate FinFET

open access: yesIEEE Journal of the Electron Devices Society, 2015
Dual-independent-gate silicon FinFET has demonstrated a steep subthreshold slope (SS) when a positive feedback induced by weak impact ionization is triggered.
Jian Zhang   +4 more
doaj   +1 more source

Experimental comparison of models for ultrafast impact ionization is silicon

open access: yes, 2016
We compare experimentally the exponential and quadratic (Keldysh formula) impact ionization models using THz induced impact ionization in silicon. We demonstrate that the exponential model offers the best description of impact ionization process for ...
Tarekegne, Abebe Tilahun   +5 more
core   +1 more source

Counterion Dependent Side‐Chain Relaxation Stiffens a Chemically Doped Thienothiophene Copolymer

open access: yesAdvanced Functional Materials, EarlyView.
Oxidation of a thienothiophene copolymer, p(g3TT‐T2), via different doping strategies and dopant molecules resulted in materials with similar oxidation levels and a high electrical conductivity of ≈100 S cm−1. However, mechanical properties varied significantly, with sub‐glass transition temperatures and elastic moduli spanning from –44°C to –3°C and ...
Mariavittoria Craighero   +12 more
wiley   +1 more source

Role of Intrinsic Electron Trapping in Negative Charging of Amorphous Alumina

open access: yesAdvanced Functional Materials, EarlyView.
Intrinsic electron trapping in amorphous Al2O3 is examined using hybrid‐DFT models spanning a wide density range. Both spontaneous and thermally activated trapping are identified, with pronounced spontaneous localization in dense, partly crystallized structures.
Jack W. Strand   +5 more
wiley   +1 more source

Impact of Silicon Substrate with Low Resistivity on Vertical Leakage Current in AlGaN/GaN HEMTs

open access: yesApplied Sciences, 2019
The role of low-resistivity substrate on vertical leakage current (VLC) of AlGaN/GaN-on-Si epitaxial layers has been investigated. AlGaN/GaN high-electron-mobility transistors (HEMTs) grown on both p-type and n-type Si substrates with low resistivity are
Chunyan Song   +12 more
doaj   +1 more source

Nonlocal impact ionization and avalanche multiplication

open access: yes, 2010
Impact ionization and avalanche multiplication are conventionally described in terms of ionization coefficients which depend only upon the local electric field.
J P R David   +3 more
core   +1 more source

Liquid Phase Transmission Electron Microscopy: A Window into the Early Stages of Complex Material Formation

open access: yesAdvanced Functional Materials, EarlyView.
Liquid‐phase transmission electron microscopy enables direct observation of nucleation and growth processes in solution. This review is dedicated to the remembrance of Helmut Cölfen and highlights recent studies on complex materials—oxides, biominerals, organic–inorganic crystals—which were central to his research activity. It summarizes key milestones,
Charles Sidhoum   +5 more
wiley   +1 more source

The Origin of Gate Degradation Under HTRB Operation: Buffer Engineering to Suppress Impact Ionization in GaN HEMT

open access: yesIEEE Access
This study investigates the origin of gate degradation in AlGaN/GaN HEMTs under high-temperature reverse bias (HTRB) conditions and proposes a buffer engineering strategy to mitigate this degradation.
Mahmut Can Soydan   +3 more
doaj   +1 more source

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