Results 211 to 218 of about 3,381 (218)
Some of the next articles are maybe not open access.
Origin of Interface States and Oxide Charges Generated by Ionizing Radiation
IEEE Transactions on Nuclear Science, 1976C T Sah
exaly
A Framework for Understanding Radiation-Induced Interface States in SiO2 MOS Structures
IEEE Transactions on Nuclear Science, 1980F B Mclean
exaly
Spectroscopic observation of interface states of ultrathin silicon oxide
Journal of Applied Physics, 1996Yoshiyuki Yamashita +2 more
exaly
Interface localized states in coupled superlattices
Journal of Applied Physics, 1992G Ihm, Michael L Falk, K Y Lim
exaly
Interface States in Gate Stack of Carbon Nanotube Array Transistors
ACS NanoSujuan Ding +2 more
exaly
A new charge pumping method of measuring Si‐SiO2interface states
Journal of Applied Physics, 1987exaly
Interface states and interface disorder in the Si-SiO2 system
Microelectronics Reliability, 1967openaire +1 more source

