Results 311 to 315 of about 6,332,703 (315)
Some of the next articles are maybe not open access.
Theory of Si/NiSi2 interface states
Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1985exaly
A new charge pumping method of measuring Si‐SiO2interface states
Journal of Applied Physics, 1987exaly

