Results 21 to 30 of about 94 (88)

Fast and Slow Stages of Lifetime Degradation by Boron–Oxygen Centers in Crystalline Silicon

physica status solidi (b), Volume 257, Issue 1, January 2020., 2020
Apparently contradicting experiments on the light‐induced degradation (LID) in boron‐doped oxygen‐containing crystalline silicon are resolved by introduction of a concept of different kinds of activating impurities participating in boron–oxygen recombination centers.
Jan Schmidt, Karsten Bothe, Vladimir V. Voronkov, Robert Falster   +3 more
wiley   +1 more source

Comments on the paper by Mariusz W. Majewski published in Studia Historiae Scientiarum 17 (2018), pp. 89–117

Studia Historiae Scientiarum, 2019
Several remarks on the text by Mariusz W. Majewski devoted to the history of the Institute of Metallurgy and Metal Science at the Technical University of Warsaw, and on the role of Prof. Jan Czochralski, are presented.
Paweł E. Tomaszewski
doaj   +1 more source

Temperature Measurement Using Optical Fiber Methods: Overview and Evaluation

Journal of Sensors, Volume 2020, Issue 1, 2020., 2020
The paper deals with the overview of fiber optic methods suitable for temperature measurement and monitoring. The aim is to evaluate the current research of temperature measurements in the interval from temperature close to 0 up to 1000°C. Since the measuring chain is a functional combination of optical methods, optical fiber properties, and other ...
Martin Mikolajek, Radek Martinek, Jiri Koziorek, Stanislav Hejduk, Jan Vitasek, Ales Vanderka, Radek Poboril, Vladimir Vasinek, Radim Hercik, Qiang Wu   +9 more
wiley   +1 more source

The works of the Institute of Metallurgy and Metallurgical Sciences at the Warsaw University of Technology, and the person of Jan Czochralski (in Polish)

Studia Historiae Scientiarum, 2018
The article discusses the issues of implementation of important achievements in the field of metallurgy (including armored weapons, fortifications and the navy), under the supervision of prof.
Mariusz W. Majewski
doaj   +1 more source

Nauka i uczeni w biografiach Anny Czerwińskiej-Rydel

Acta Universitatis Lodziensis. Folia Librorum, 2018
Publikacje poświęcone nauce stanowią ważną część współczesnego rynku książki dla dzieci. W zdecydowanej większości mają one formę dostosowanych do wieku dziecka leksykonów i miniencyklopedii, zarówno o charakterze ogólnym, jak i poświęconych określonemu ...
Rafał Kępa
doaj   +1 more source

Jan Czochralski – pionier światowej elektroniki i inżynierii materiałowej

Dzieje Najnowsze, 2020
Artykul ma na celu przedstawienie sylwetki Jana Czochralskiego, światowej slawy naukowca XX w. Jego glownym osiągnieciem bylo wynalezienie metody uzyskiwania monokrysztalow, do dziś stosowanej w produkcji ukladow scalonych wielkiej skali integracji. Po zakonczeniu II wojny światowej Czochralski calkowicie bezpostawnie zostal oskarzony o kolaboracje z ...
openaire   +2 more sources

Occupation as Social Practice and Ambiguous Space: The Lives of Ludwik Hirszfeld and Jan Czochralski in Warsaw, 1939–44

Acta Poloniae Historica, 2022
This article evaluates the situation of two renowned scientists in Poland, namely the microbiologist and serologist Ludwik Hirszfeld (1884–1954), and the metallurgist Jan Czochralski (1885–1953), during the time of the German occupation from 1939–45. Both scientists strove to continue their scientific work even under the conditions of occupation but ...
openaire   +1 more source

Microstructural Analysis of Local Silicon Corrosion of Bifacial Solar Cells as Root Cause of Potential‐Induced Degradation at the Rear Side

physica status solidi (a), Volume 216, Issue 17, September 2019., 2019
Bifacial passivated emitter and rear cells (PERC+) can suffer from a potential‐induced degradation (PID) at the rear side. A microstructural analysis shows localized spots with increased carrier recombination as the origin of the power losses. A corrosion of the silicon bulk at the silicon/aluminium oxide interface is the root cause of the degradation.
Kai Sporleder, Volker Naumann, Jan Bauer, Susanne Richter, Angelika Hähnel, Stephan Großer, Marko Turek, Christian Hagendorf   +7 more
wiley   +1 more source

Solid‐Solution Limits and Thorough Characterization of Bulk β‐(AlxGa1‐x)2O Single Crystals Grown by the Czochralski Method (Adv. Mater. Interfaces 2/2025)

Advanced Materials Interfaces, Volume 12, Issue 2, January 20, 2025.
Czochralski Method High‐angle annular dark‐field scanning transmission electron microscopy image of a β‐(Al0.2Ga0.8)2O3 crystal along the [010] projection grown by the Czochralski method. More details can be found in article 2400122 by Zbigniew Galazka and co‐workers.
Zbigniew Galazka, Andreas Fiedler, Andreas Popp, Palvan Seyidov, Saud Bin Anooz, Roberts Blukis, Jana Rehm, Kornelius Tetzner, Mike Pietsch, Andrea Dittmar, Steffen Ganschow, Arub Akhtar, Thilo Remmele, Martin Albrecht, Tobias Schulz, Ta‐Shun Chou, Albert Kwasniewski, Manuela Suendermann, Thomas Schroeder, Matthias Bickermann   +19 more
wiley   +1 more source

Recent Advanced Ultra‐Wide Bandgap β‐Ga2O3 Material and Device Technologies

Advanced Electronic Materials, Volume 11, Issue 1, January 2025.
The advanced ultra‐wide bandgap semiconductor material β‐Ga2O3 is highly favored for its exceptional material properties. This sudy provides a comprehensive review of its developments in areas such as materials, power devices, and RF devices. The current status of its commercialization process is outlined, along with an analysis of the challenges it is
Sihan Sun, Chenlu Wang, Sami Alghamdi, Hong Zhou, Yue Hao, Jincheng Zhang   +5 more
wiley   +1 more source