Results 31 to 40 of about 2,395 (142)
We present the characterization of 8-12 GHz whispering gallery mode resonators machined in high-quality sapphire crystals elaborated with different growth techniques.
Dubois, Benoit +3 more
core +3 more sources
TOPCon Solar Cells Made of n‐Type and p‐Type Epitaxially Grown Silicon Wafers
This study investigates the suitability of epitaxially grown silicon wafers for tunnel oxide passivating contact (TOPCon) solar cells in particular the high temperature stability required for boron emitter diffusion. Efficiencies up to 24.4% and 24.7% for n‐type and p‐type wafers were achieved, respectively, which demonstrate the suitability of ...
Armin Richter +8 more
wiley +1 more source
Bifacial passivated emitter and rear cells (PERC+) can suffer from a potential‐induced degradation (PID) at the rear side. A microstructural analysis shows localized spots with increased carrier recombination as the origin of the power losses. A corrosion of the silicon bulk at the silicon/aluminium oxide interface is the root cause of the degradation.
Kai Sporleder +7 more
wiley +1 more source
Seventy Years of Getting Transistorized [PDF]
Vacuum tubes appeared at the break of the twentieth century giving birth to electronics. By the 1930s, they had become established as a mature technology, spreading into areas such as radio communications, long distance radiotelegraphy, radio ...
Guarnieri, Massimo
core +1 more source
Czochralski Method High‐angle annular dark‐field scanning transmission electron microscopy image of a β‐(Al0.2Ga0.8)2O3 crystal along the [010] projection grown by the Czochralski method. More details can be found in article 2400122 by Zbigniew Galazka and co‐workers.
Zbigniew Galazka +19 more
wiley +1 more source
Recent Advanced Ultra‐Wide Bandgap β‐Ga2O3 Material and Device Technologies
The advanced ultra‐wide bandgap semiconductor material β‐Ga2O3 is highly favored for its exceptional material properties. This sudy provides a comprehensive review of its developments in areas such as materials, power devices, and RF devices. The current status of its commercialization process is outlined, along with an analysis of the challenges it is
Sihan Sun +5 more
wiley +1 more source
The behavior of iron, iron‐boron (FeB) pairs, and iron‐boron‐phosphorus (FeB‐P) complexes has been studied in B‐doped Czochralski silicon with phosphorus (P) compensation and compared with that in uncompensated material. The interstitial iron concentration has been measured at temperatures from 50 to 270°C.
Xiaodong Zhu +6 more
wiley +1 more source
Determination of Gallium Concentration in Silicon from Low‐Temperature Photoluminescence Analysis
A simple method for determining the gallium concentration in silicon for solar photovoltaic applications is presented. It relies on the intensity ratio for bound exciton to the free exciton peaks from photoluminescence measurements at 10 K. The empirical relation describing the calibration curve is deduced, and the effect of temperature and power on ...
Tarek O. Abdul Fattah +7 more
wiley +1 more source
This paper gives a review of some recent developments in the field of contactless silicon wafer characterization techniques based on lifetime spectroscopy and infrared imaging. In the first part of the contribution, we outline the status of different lifetime spectroscopy approaches suitable for the identification of impurities in silicon and discuss ...
Jan Schmidt +4 more
wiley +1 more source
The monoclinic crystal structure of $\beta$-$\mathrm{Ga_2O_3}$ leads to significant anisotropy of the thermal properties. The 2$\omega$-method is used to measure the thermal diffusivity $D$ in [010] and [001] direction respectively and to determine the ...
Fischer, Saskia F. +3 more
core +1 more source

