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Potentiometric Measurement With a Kelvin Probe: Contactless Measurement of Chloride Ions in Aqueous Electrolyte [PDF]
Sensors and Actuators B: Chemical, 2016 For the first time the chloride ion concentration in electrolyte is measured using a Kelvin probe. A silver-silver chloride (Ag/AgCl) electrode, which is a chloride ion selective electrode, is used as a sample plate in the electrolyte and the Kelvin ...
Albert van den Berg +2 more
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Electrochimica Acta, 2007
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Michael Rohwerder
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With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Michael Rohwerder
exaly +3 more sources
Three-Dimensional Kelvin Probe Force Microscopy
ACS Applied Materials & Interfaces, 2022Traditional Kelvin probe force microscopy (KPFM) is mainly limited to the characterization of two-dimensional (2D) surfaces, and in situ surface potential (SP) imaging along 3D device surfaces remains a challenge. This paper presents a multimode 3D-KPFM based on an orthogonal cantilever probe (OCP) that can achieve SP mapping of 3D micronano structures.
Junyuan Geng +5 more
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Pulsed Force Kelvin Probe Force Microscopy
ACS Nano, 2020Abstract Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force microscopy, has been widely used for surface potential and work function mapping ...
Haomin Wang, Devon S Jakob, Xiaoji G Xu
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Pitfalls in Kelvin probe measurements
Journal of Applied Physics, 2009We report on the interpretation of thickness-dependent surface potential profiles in insulators on metal substrates measured by Kelvin probe method. The electrical potentials are calculated within a self-consistent model taking both the conductive substrate and the insulator into account.
Oliver M. Ottinger +2 more
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Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher +2 more
openaire +1 more source
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher +2 more
openaire +1 more source
Journal of Physics E: Scientific Instruments, 1972
A probe for use in measurements of contact potential differences (CPD) has been designed and constructed. The probe has the following unique features: (i) it is guarded against capacitive coupling between the probe and surfaces other than the sample; (ii) it can be heated so that adsorbed gases can be flashed off; (iii) it is excellent for use in UHV ...
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A probe for use in measurements of contact potential differences (CPD) has been designed and constructed. The probe has the following unique features: (i) it is guarded against capacitive coupling between the probe and surfaces other than the sample; (ii) it can be heated so that adsorbed gases can be flashed off; (iii) it is excellent for use in UHV ...
openaire +1 more source
Kelvin Probe Force Microscopy in Nonpolar Liquids
Langmuir, 2012Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A. +8 more
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Signal reversal in Kelvin-probe force microscopy
Review of Scientific Instruments, 2019Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
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