Results 241 to 250 of about 720,686 (280)

Kelvin Probe Force Microscope

2018
KPFM mode as shown in Fig. 51.1 generates images based on the electric potential of the sample surface. Applying an AC voltage to a conductive cantilever and detecting the resulting electric force makes it possible to observe the surface profile and, at the same time, the surface potential distribution.
openaire   +1 more source

A micromachined gold–palladium Kelvin probe for hydrogen sensing

Sensors and Actuators B: Chemical, 2009
In this paper we discuss the fundamental principles of the Kelvin probe apparatus; in particular, first, we find an analytical relation for the sensitivity of vibrating capacitors, so that the advantages of integration can be quantitatively estimated; second, we describe an equivalent electric circuit for vibrating capacitors, thus allowing to simulate
A D'Amico, C Di Natale, E Martinelli, A Tibuzzi, B Margesin, F Giacomozzi, G Soncini, C Calaza, F Ficorella, S Iarossi   +9 more
openaire   +3 more sources

Improvements of the piezoelectric driven Kelvin probe

Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1984
La methode de condensateur vibrant de Kelvin-Zisman est une technique sensible pour mesurer la difference de potentiel de contact entre deux surfaces. On l'applique a l'etude des variations de travail de sortie avec la temperature et a l'adsorption des gaz sur les surfaces. Description de certaines ameliorations du condensateur.
S. Saito, T. Soumura, T. Maeda
openaire   +1 more source

Kelvin Probe Force Microscopy of Semiconductors

2007
Due to their technological importance, III–V compound semiconductors have been widely studied. While extensive work has been done on their geometric and electronic structure, Kelvin probe force microscopy (KPFM) in ultrahigh vacuum (UHV) creates the possibility to study the electronic structure of the surfaces on a nanometer scale [1].
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner   +5 more
openaire   +1 more source

Principles of Kelvin Probe Force Microscopy

2007
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high ...
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks   +4 more
openaire   +1 more source

New Feedback Kelvin Probe

Review of Scientific Instruments, 1968
Y. Petit-Clerc, J. D. Carette
openaire   +1 more source

Kelvin Probe: Kelvin Probe Force Microscopy as a Tool for the Characterization of Nanomaterials

2016
openaire   +1 more source

Ultraviolet Photoemission Spectroscopy and Kelvin Probe Measurements on Metal Halide Perovskites: Advantages and Pitfalls

Advanced Energy Materials, 2020
Fengyu Zhang, Antoine Kahn, Florian Ullrich   +2 more
exaly  

Kelvin Probe

2016
openaire   +1 more source

Kelvin Probe Force Microscopy and Its Application

Surface Science Reports, 2011
Sangyeob Lee, Andrew C Kummel, Wilhelm Melitz   +2 more
exaly