Results 31 to 40 of about 720,686 (280)
High-Bandwidth Multiparametric Kelvin Probe Force Microscopy With Polymer Microcantilevers
IEEE Access, 2019 Simultaneous and rapid measurement of the surface potential (SP) and nanomechanical properties (NMPs) of materials plays an important role in the study of, for example, piezoelectric materials and multi-component composites.
Hao Zhang +5 more
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Charge-Sensitive Technique for Deformation Processes’ Study
Приборы и методы измерений, 2022 Surface charge can be used as an information parameter about the change in the state of the material under the action of mechanical stresses. The aim of the work was to develop methods for studying deformation processes in metallic and polymeric ...
K. U. Pantsialeyeu +5 more
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Object size effect on the contact potential difference measured by scanning Kelvin probe method [PDF]
, 2010 Contact potential difference (CPD) was measured by macroscopic Kelvin probe instrument and scanning Kelvin probe microscope on Al, Ni and Pt on ITO substrates at ambient conditions.
I. Tale +11 more
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The effect of sample resistivity on Kelvin probe force microscopy [PDF]
, 2012 Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction.
Weymouth, Alfred Jay, Giessibl, Franz J.
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Приборы и методы измерений, 2017 Introduction of submicron design standards into microelectronic industry and a decrease of the gate dielectric thickness raise the importance of the analysis of microinhomogeneities in the silicon-silicon dioxide system.
V. А. Pilipenko +9 more
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Universal Digital Probe Electrometer for Testing Semiconductor Wafers
Приборы и методы измерений, 2023 Non-contact electrical methods are widely used for research and control of semiconductor wafers. The methods are usually based on surface potential measurement (CPD) in combination with illumination and/or deposition of charges on the sample using a ...
A. L. Zharin +3 more
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Noise performance of frequency modulation Kelvin force microscopy
Beilstein Journal of Nanotechnology, 2014 Noise performance of a phase-locked loop (PLL) based frequency modulation Kelvin force microscope (FM-KFM) is assessed. Noise propagation is modeled step by step throughout the setup using both exact closed loop noise gains and an approximation known as “
Heinrich Diesinger +2 more
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Toward quantitative Kelvin probe force microscopy of nanoscale potential distributions [PDF]
, 2012 Kelvin probe force spectroscopy KPFS and amp; 64257;nite element method FEM simulations were employed to investigate the averaging effect of the work function signals of nanoscale potential distributions in Kelvin probe force microscopy KPFM .
Leendertz, Caspar +7 more
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MOVPE-Grown Quantum Cascade Laser Structures Studied by Kelvin Probe Force Microscopy
Crystals, 2020 A technique for direct study of the distribution of the applied voltage within a quantum cascade laser (QCL) has been developed. The detailed profile of the potential in the laser claddings and laser core region has been obtained by gradient scanning ...
Konstantin Ladutenko +3 more
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Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).
, 2017 Measured Contact Potential Difference (CPD) by Kelvin Probe Force Microscopy (KPFM).
Haifeng Zhang (137541), Ting Su (640554)
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