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Kelvin probe force microscopy for material characterization [PDF]
Microscopy, 2022 Abstract Kelvin probe force microscopy is a scanning probe method for imaging the surface potential by atomic force microscopy. The surface potential is one of the most important surface properties and is correlated to e.g. the work function, surface dipoles, localized surface charges and structural properties.
Thilo Glatzel, Urs Gysin, Ernst Meyer
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Pulsed Force Kelvin Probe Force Microscopy-A New Type of Kelvin Probe Force Microscopy under Ambient Conditions. [PDF]
J Phys Chem C Nanomater InterfacesKelvin probe force microscopy (KPFM) is an increasingly popular scanning probe microscopy technique used for nanoscale imaging of surface potential for various materials, such as metals, semiconductors, biological samples, and photovoltaics, to reveal their surface work function and/or local accumulation of charges.
Zahmatkeshsaredorahi A, Jakob DS, Xu XG.
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Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]
, 2013 The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Blanc, Christine +5 more
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Electrical Study of Trapped Charges in Copper-Doped Zinc Oxide Films by Scanning Probe Microscopy for Nonvolatile Memory Applications. [PDF]
PLoS ONE, 2017 Charge trapping properties of electrons and holes in copper-doped zinc oxide (ZnO:Cu) films have been studied by scanning probe microscopy. We investigated the surface potential dependence on the voltage and duration applied to the copper-doped ZnO films
Ting Su, Haifeng Zhang
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Metals, 2023 The atmospheric corrosion of high-strength steels can lead to hydrogen absorption directly linked to hydrogen embrittlement or delayed fracture phenomena.
Flavien Vucko +2 more
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Suitability of Various Materials for Probes in Scanning Kelvin Probe Measurements [PDF]
physica status solidi (a), 2017 Volta potential of a material can be easily determined by using scanning Kelvin probe (SKP), but up to now there is no standard method established. This study focuses on finding an alternative or even a standard material for SKP probes. Re, Ni, and Mo are analyzed regarding their suitability for serving as tips in SKP measurements.
Silvia Huber +2 more
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Приборы и методы измерений, 2017 At present for analysis of the homogeneity of materials properties are becoming widely used various modifications of a scanning Kelvin probe. These methods allow mapping the spatial distribution of the electrostatic potential.
K. U. Pantsialeyeu +6 more
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Communications Chemistry, 2021 Rutile TiO2 is a prominent photocatalyst for overall water splitting, but the on-surface activation of hydrogen atoms is still not fully understood. Here, the authors use atomic force and kelvin probe force microscopy to study the lateral manipulation of
Yuuki Adachi +3 more
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High spatial resolution Kelvin probe force microscopy with coaxial probes [PDF]
Nanotechnology, 2012 Kelvin probe force microscopy (KPFM) is a widely used technique to measure the local contact potential difference (CPD) between an AFM probe and the sample surface via the electrostatic force. The spatial resolution of KPFM is intrinsically limited by the long range of the electrostatic interaction, which includes contributions from the macroscopic ...
Brown, Keith A. +2 more
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, 2013 We report the determination of the surface recombination velocity of electron-hole pairs for silicon samples passivated with organic monolayers using the Kelvin probe.
Ibrahim, Mohd Adib +4 more
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