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Molecular dynamics simulations and Kelvin probe force microscopy to study of cholesterol-induced electrostatic nanodomains in complex lipid mixtures. [PDF]

Soft Matter, 2017
Drolle E, Bennett WF, Hammond K, Lyman E, Karttunen M, Leonenko Z.   +5 more
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Pulsed Force Kelvin Probe Force Microscopy

ACS Nano, 2020
Measurement of the contact potential difference (CPD) and work functions of materials are important in analyzing their electronic structures and surface residual charges. Kelvin probe force microscopy (KPFM), an imaging technique of atomic force microscopy, has been widely used for surface potential and work function mapping at the nanoscale.
Devon S. Jakob, Haomin Wang, Xiaoji G. Xu   +2 more
openaire   +4 more sources

Kelvin probe force microscopy and its application

Surface Science Reports, 2011
Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results.
Wilhelm Melitz, Jian Shen, Andrew C. Kummel, Sangyeob Lee   +3 more
openaire   +3 more sources

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Electrochimica Acta, 2007
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Rohwerder, M., Turcu, E.
exaly   +5 more sources

Three-Dimensional Kelvin Probe Force Microscopy

ACS Applied Materials & Interfaces, 2022
Traditional Kelvin probe force microscopy (KPFM) is mainly limited to the characterization of two-dimensional (2D) surfaces, and in situ surface potential (SP) imaging along 3D device surfaces remains a challenge. This paper presents a multimode 3D-KPFM based on an orthogonal cantilever probe (OCP) that can achieve SP mapping of 3D micronano structures.
Junyuan Geng, Hao Zhang, Xianghe Meng, Haibo Gao, Weibin Rong, Hui Xie   +5 more
openaire   +2 more sources

Kelvin probe force microscopy under ambient conditions

Nature Reviews Methods Primers
Amirhossein Zahmatkeshsaredorahi, Ruben Millan-Solsona, Devon S. Jakob, Liam Collins, Xiaoji G. Xu   +4 more
exaly   +6 more sources

Quantitative Kelvin Probe Force Microscopy

MRS Proceedings, 2009
AbstractIn this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements. Due to the formation of an asymmetric electric dipole at the semiconductor surface, the measured KPFM bias is related with the energy difference between Fermi energy
Baumgart, C., Helm, M., Schmidt, H.
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Kelvin probe force microscopy

Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe   +2 more
openaire   +1 more source

Kelvin Probe Force Microscopy in Nonpolar Liquids

Langmuir, 2012
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A., Sengupta, E., Bley, K., Untch, M., Weber, S., Landfester, K., Weiss, C., Butt, H., Berger, R.   +8 more
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Signal reversal in Kelvin-probe force microscopy

Review of Scientific Instruments, 2019
Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
openaire   +3 more sources