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Preventing probe induced topography correlated artifacts in Kelvin Probe Force Microscopy
Ultramicroscopy, 2016Kelvin Probe Force Microscopy (KPFM) on samples with rough surface topography can be hindered by topography correlated artifacts. We show that, with the proper experimental configuration and using homogeneously metal coated probes, we are able to obtain amplitude modulation (AM) KPFM results on a gold coated sample with rough topography that are free ...
Polak, L., Wijngaarden, Rinke J.
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Kelvin Probe Force Microscopy with Atomic Resolution
2018The surface potential distribution measured using Kelvin probe force microscopy (KPFM) is influenced by the contact potential difference (CPD) between the tip and surface, the stray capacitance of the cantilever, and fixed monopole charges on the surface and tip. The interpretation of atomic-scale KPFM contrast studies has been controversial.
Yan Jun Li +5 more
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Force gradient sensitive detection in lift-mode Kelvin probe force microscopy
Nanotechnology, 2011We demonstrate frequency modulation Kelvin probe force microscopy operated in lift-mode under ambient conditions. Frequency modulation detection is sensitive to force gradients rather than forces as in the commonly used amplitude modulation technique.
Dominik, Ziegler, Andreas, Stemmer
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KELVIN PROBE FORCE MICROSCOPY OF MOLECULAR SURFACES
Annual Review of Materials Science, 1999▪ Abstract The electrostatic force microscope is one of many specialized tip sensors used in near-field microscopy. This type of microscope is realized by applying a voltage on a conducting AFM tip. It can be used to image samples that present a distribution of electrical properties on inhomogeneous materials as well as on nanostructures.
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Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductors
2018As is well known, Kelvin Probe Force Microscopy (KPFM) is a powerful and versatile tool to measure the contact potential difference (CPD) in metals. Here, we discuss the application of KPFM for the investigation of semiconducting materials, where the interpretation of KPFM is complicated by band bending and surface charge.
Polak, Leo, Wijngaarden, Rinke J.
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Scanning Kelvin Probe Force Microscopy
Journal of The Electrochemical Society, 2004D. Bengtsson Blücher +4 more
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Real-space imaging of anisotropic charge of σ-hole by means of Kelvin probe force microscopy
Science, 2021Benjamin Mallada +2 more
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