Results 211 to 220 of about 25,733 (269)

Real-space imaging of anisotropic charge of σ-hole by means of Kelvin probe force microscopy

Science, 2021
Description Resolution of the σ-hole Anisotropic distribution of charges on atoms plays an important role in intermolecular interactions, yet direct experimental imaging remains a long-standing challenge.
B. Mallada, A. Gallardo, M. Lamanec, B. de la Torre, V. Špirko, P. Hobza, P. Jelinek   +6 more
semanticscholar   +1 more source

Imaging Spatial Distribution of Photogenerated Carriers in Monolayer MoS2 with Kelvin Probe Force Microscopy.

ACS Applied Materials and Interfaces, 2022
The spatial distribution of photogenerated carriers in atomically thin MoS2 flakes is investigated by measuring surface potential changes under light illumination using Kelvin probe force microscopy (KPFM).
Woongbin Yim, V. T. Nguyen, Quỳnh Thị Phùng, Hwan Sik Kim, Y. Ahn, Soonil Lee, Ji-Yong Park   +6 more
semanticscholar   +1 more source

Kelvin probe force microscopy and its application

Surface Science Reports, 2011
Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results.
W. Melitz, Jian Shen, A. Kummel, Sangyeob Lee   +3 more
semanticscholar   +2 more sources

Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping.

Small, 2021
Kelvin probe force microscopy (KPFM) is a popular technique for mapping the surface potential at the nanoscale through measurement of the Coulombic force between an atomic force microscopy (AFM) tip and sample. The lateral resolution of conventional KPFM
D. Jakob, Nengxu Li, Huanping Zhou, Xiaoji G. Xu   +3 more
semanticscholar   +1 more source

Quantitative Kelvin Probe Force Microscopy

MRS Proceedings, 2009
AbstractIn this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements. Due to the formation of an asymmetric electric dipole at the semiconductor surface, the measured KPFM bias is related with the energy difference between Fermi energy
Baumgart, C., Helm, M., Schmidt, H.
openaire   +2 more sources

Far-Infrared Near-Field Optical Imaging and Kelvin Probe Force Microscopy of Laser-Crystallized and -Amorphized Phase Change Material Ge3Sb2Te6.

Nano letters (Print), 2021
Chalcogenide phase change materials reversibly switch between non-volatile states with vastly different optical properties, enabling novel active nanophotonic devices.
J. Barnett, Lukas Wehmeier, A. Hessler, M. Lewin, J. Pries, M. Wuttig, J. Klopf, S. Kehr, L. Eng, T. Taubner   +9 more
semanticscholar   +1 more source

Kelvin probe force microscopy

Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe   +2 more
openaire   +1 more source

Kelvin Probe Force Microscopy Reveals Spatially Resolved Charge-Transfer Mechanism in CdS/BiOBr S-scheme Heterojunction Photocatalyst.

Angewandte Chemie
S-scheme heterojunctions hold great promise for photocatalysis, yet a comprehensive understanding of their charge-transfer mechanisms remains limited.
Zheng Meng, Jianjun Zhang, Haoyu Long, Hermenegildo García, Liuyang Zhang, Bicheng Zhu, Jiaguo Yu   +6 more
semanticscholar   +1 more source

Kelvin Probe Force Microscopy in Nonpolar Liquids

Langmuir, 2012
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A., Sengupta, E., Bley, K., Untch, M., Weber, S., Landfester, K., Weiss, C., Butt, H., Berger, R.   +8 more
openaire   +3 more sources

Signal reversal in Kelvin-probe force microscopy

Review of Scientific Instruments, 2019
Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
openaire   +3 more sources