Results 221 to 230 of about 7,385 (266)

Kelvin probe force microscopy study on nanotriboelectrification

Applied Physics Letters, 2010
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The electrostatic potentials produced by the friction between the atomic force microscope tips and the substrates are recorded with KFM and the electric quantity is calculated.
Haibin Chu, Ding Lei
exaly   +3 more sources

Quantitative Kelvin Probe Force Microscopy

MRS Proceedings, 2009
AbstractIn this paper we report on the investigation of electrostatic forces between a conductive probe and semiconducting materials by means of Kelvin probe force microscopy measurements. Due to the formation of an asymmetric electric dipole at the semiconductor surface, the measured KPFM bias is related with the energy difference between Fermi energy
Baumgart, C., Helm, M., Schmidt, H.
openaire   +3 more sources

Signal reversal in Kelvin-probe force microscopy

Review of Scientific Instruments, 2019
Kelvin-probe force microscopy is a measurement mode of atomic force microscopy, which is used to quantitatively map the electrical surface potential of a sample. Inadequate hardware and electronic design can lead to signal cross talk and, in consequence, false results.
P. Mesquida, D. Kohl, G. Schitter
core   +5 more sources

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Kelvin probe force microscopy and its application

Surface Science Reports, 2011
Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results.
Andrew C Kümmel, Sangyeob Lee
exaly   +2 more sources

The influence of surface topography on Kelvin probe force microscopy

Nanotechnology, 2009
Long-range electrostatic forces govern the imaging mechanism in electrostatic force microscopy as well as in Kelvin probe force microscopy. To improve the analysis of such images, simulations of the electrostatic field distribution have been performed in the past using a flat surface and a cone-shaped tip.
S, Sadewasser, C, Leendertz, F, Streicher, M Ch, Lux-Steiner   +3 more
openaire   +3 more sources

Kelvin Probe Force Microscopy

, 2018
This book provides a comprehensive introduction to the methods and variety of Kelvin probe force microscopy, including technical details. It also offers an overview of the recent developments and numerous applications, ranging from semiconductor ...
Sadewasser, Sascha, Glatzel, Thilo
openaire   +3 more sources

Three-Dimensional Kelvin Probe Force Microscopy

ACS Applied Materials & Interfaces, 2022
Traditional Kelvin probe force microscopy (KPFM) is mainly limited to the characterization of two-dimensional (2D) surfaces, and in situ surface potential (SP) imaging along 3D device surfaces remains a challenge. This paper presents a multimode 3D-KPFM based on an orthogonal cantilever probe (OCP) that can achieve SP mapping of 3D micronano structures.
Junyuan Geng, Hao Zhang, Xianghe Meng, Haibo Gao, Weibin Rong, Hui Xie   +5 more
openaire   +2 more sources

Signal amplitude and sensitivity of the Kelvin probe force microscopy

Applied Physics Letters, 2006
When the tip-sample distance is small, Kelvin probe force microscopy is affected by parametric amplification. This is due to the fact that the electric force has two components; the higher one having a frequency exactly twice as high as the lower.
T Ouisse, F Martins, J Chevrier
exaly   +2 more sources

Kelvin probe force microscopy

Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe   +2 more
openaire   +1 more source

Kelvin Probe Force Microscopy in Nonpolar Liquids

Langmuir, 2012
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A., Sengupta, E., Bley, K., Untch, M., Weber, S., Landfester, K., Weiss, C., Butt, H., Berger, R.   +8 more
openaire   +3 more sources