Results 221 to 230 of about 3,386,570 (260)

Three-Dimensional Kelvin Probe Force Microscopy

ACS Applied Materials & Interfaces, 2022
Traditional Kelvin probe force microscopy (KPFM) is mainly limited to the characterization of two-dimensional (2D) surfaces, and in situ surface potential (SP) imaging along 3D device surfaces remains a challenge. This paper presents a multimode 3D-KPFM based on an orthogonal cantilever probe (OCP) that can achieve SP mapping of 3D micronano structures.
Junyuan Geng, Hao Zhang, Xianghe Meng, Haibo Gao, Weibin Rong, Hui Xie   +5 more
openaire   +2 more sources

Signal Amplitude and Sensitivity of the Kelvin Probe Force Microscopy

Applied Physics Letters, 2006
When the tip-sample distance is small, Kelvin probe force microscopy is affected by parametric amplification. This is due to the fact that the electric force has two components; the higher one having a frequency exactly twice as high as the lower.
Frederico Martins, T Ouisse, M Stark
exaly   +2 more sources

Note: Switching Crosstalk on and Off in Kelvin Probe Force Microscopy

Review of Scientific Instruments, 2014
In Kelvin Probe Force Microscopy (KPFM) electronic crosstalk can occur between the excitation signal and probe deflection signal. Here, we demonstrate how a small modification to our commercial instrument enables us to literally switch the crosstalk on and off.
Leo Polak, Rinke J Wijngaarden
exaly   +5 more sources

Kelvin probe force microscopy

Applied Physics Letters, 1991
Measurements of the contact potential difference between different materials have been performed for the first time using scanning force microscopy. The instrument has a high resolution for both the contact potential difference (better than 0.1 mV) and the lateral dimension (<50 nm) and allows the simultaneous imaging of topography and contact ...
M. Nonnenmacher, M. P. O’Boyle, H. K. Wickramasinghe   +2 more
openaire   +1 more source

Kelvin Probe Force Microscopy in Nonpolar Liquids

Langmuir, 2012
Work function changes of Au were measured by Kelvin probe force microscopy (KPFM) in the nonpolar liquid decane. As a proof of principle for the measurement in liquids, we investigated the work function change of an Au substrate upon hexadecanethiol chemisorption.
Domanski, A., Sengupta, E., Bley, K., Untch, M., Weber, S., Landfester, K., Weiss, C., Butt, H., Berger, R.   +8 more
openaire   +3 more sources

Kelvin Probe Force Microscopy Study on Nanotriboelectrification

Applied Physics Letters, 2010
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The electrostatic potentials produced by the friction between the atomic force microscope tips and the substrates are recorded with KFM and the electric quantity is calculated.
Haibin Chu, Jinyong Wang
exaly   +2 more sources

Kelvin Probe Force Microscopy and Its Application

Surface Science Reports, 2011
Kelvin probe force microscopy (KPFM) is a tool that enables nanometer-scale imaging of the surface potential on a broad range of materials. KPFM measurements require an understanding of both the details of the instruments and the physics of the measurements to obtain optimal results.
Sangyeob Lee, Andrew C Kummel, Wilhelm Melitz   +2 more
exaly   +2 more sources

Kelvin Probe Force Microscopy of Semiconductors

2007
Due to their technological importance, III–V compound semiconductors have been widely studied. While extensive work has been done on their geometric and electronic structure, Kelvin probe force microscopy (KPFM) in ultrahigh vacuum (UHV) creates the possibility to study the electronic structure of the surfaces on a nanometer scale [1].
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner   +5 more
openaire   +1 more source

Principles of Kelvin Probe Force Microscopy

2007
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high ...
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks   +4 more
openaire   +1 more source

Note: On the deconvolution of Kelvin probe force microscopy data

Review of Scientific Instruments, 2010
In Kelvin probe force microscopy (KPFM) proper interpretation of the data is often difficult because the measured surface potential is affected by the interaction of the cantilever with the sample. In this work, the tip's interaction with a modeled surface potential distribution was simulated, leading to a calculated KPFM image.
A, Blümel, H, Plank, A, Klug, E, Fisslthaler, M, Sezen, W, Grogger, E J W, List   +6 more
openaire   +2 more sources