Results 241 to 250 of about 7,385 (266)

Scanning Capacitance Force Microscopy and Kelvin Probe Force Microscopy of Nanostructures Embedded in SiO2

2005
Scanning capacitance force microscopy and Kelvin probe force microscopy are used to image Sn nanometer sized structures embedded in silicon oxide thin films. The capacitance variation occurring between probe and sample in presence of a metallic cluster modifies the oscillation amplitude of the AFM probe at twice the frequency of the applied voltage ...
G Tallarida, S Spiga, M Fanciulli
openaire   +2 more sources

KELVIN PROBE FORCE MICROSCOPY OF MOLECULAR SURFACES

Annual Review of Materials Science, 1999
▪ Abstract  The electrostatic force microscope is one of many specialized tip sensors used in near-field microscopy. This type of microscope is realized by applying a voltage on a conducting AFM tip. It can be used to image samples that present a distribution of electrical properties on inhomogeneous materials as well as on nanostructures.
openaire   +1 more source

Kelvin Probe Force Microscopy

2012
Bharat Bhushan, Manuel L. B. Palacio
openaire   +2 more sources

A Tutorial on Instrumental Parameters in Pulsed Force Kelvin Probe Force Microscopy

Langmuir
For the creation of smaller and smaller electrical devices and fundamental studies, Kelvin Probe Force Microscopy (KPFM) offers a technique that measures the surface potential with nanometer lateral resolution and allows for a more precise understanding of properties such as the work function, the localization of charges and the doping of materials ...
Guillermo Lozano-Onrubia, Mikhail A. Nazarov, Gilbert C. Walker   +2 more
openaire   +2 more sources

Scanning Kelvin Probe Force Microscopy

Journal of The Electrochemical Society, 2004
D. Bengtsson Blücher, J.-E. Svensson, L.-G. Johansson, M. Rohwerder, M. Stratmann   +4 more
openaire   +1 more source

Integrated Tapping Mode Kelvin Probe Force Microscopy with Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping

Small, 2021
Devon S Jakob, Nengxu Li, Huanping Zhou   +2 more
exaly  

Electronic Characterization of Organic Thin Films by Kelvin Probe Force Microscopy

Advanced Materials, 2006
Vincenzo Palermo, Matteo Palma, P Samori   +2 more
exaly  

High-resolution Kelvin probe microscopy in corrosion science: Scanning Kelvin probe force microscopy (SKPFM) versus classical scanning Kelvin probe (SKP)

Electrochimica Acta, 2007
Michael Rohwerder
exaly  

Scanning Kelvin Probe Force Microscopy

2012
Yimei Zhu, Hiromi Inada, Achim Hartschuh, Li Shi, Ada Della Pia, Giovanni Costantini, Amadeo L. Vázquez de Parga, Rodolfo Miranda, Antoine Barbier, Cristian Mocuta, Rachid Belkhou, Bharat Bhushan, J. H. Hoo, K. S. Park, R. Baskaran, K. F. Böhringer, Wei Lu, Michael Nosonovsky, Moon-Ho Ham, Ardemis A. Boghossian, Jong Hyun Choi, Michael S. Strano, Amy Lang, Maria Laura Habegger, Philip Motta, Bharat Bhushan, Thomas Bachmann, Hermann Wagner, Donald W. Brenner, Jian Chen, Nika Shakiba, Qingyuan Tan, Yu Sun, Julia R. Greer, M. Laver, S. M. Khaled, Alessandro Parodi, Ennio Tasciotti, Bakul C. Dave, Sarah B. Lockwood, Claudia Musicanti, Paolo Gasco, Fritz Vollrath, Alexander Booth, Andy C. McIntosh, Novid Beheshti, Richard Walker, Lars Uno Larsson, Andrew Copestake, Hyundoo Hwang, Yoon-Kyoung Cho, Jian Chen, Michael Chu, Claudia R. Gordijo, Xiao Yu Wu, Yu Sun, Mathias Kolle, Ullrich Steiner, Szu-Wen Wang, Frederik Ceyssens, Robert Puers, Xiaodong Han, Shengcheng Mao, Ze Zhang, Lei Jiang, Ling Lin, Regina Ragan, Vanni Lughi, Carlos Drummond, Marina Ruths, Weiqiang Mu, John B. Ketterson, Pierre Berini, Ya-Pu Zhao, Feng-Chao Wang, Shaurya Prakash, Simon J. Henley, José V. Anguita, S. Ravi P. Silva, Munish Chanana, Cintia Mateo, Verónica Salgueirino, Miguel A. Correa-Duarte, Swastik Kar, Saikat Talapatra, Javier Calvo Fuentes, José Rivas, M. Arturo López-Quintela, Soichiro Tsuda   +88 more
openaire   +1 more source

Dual harmonic Kelvin probe force microscopy at the graphene–liquid interface

Applied Physics Letters, 2014
Liam Collins, Jason I Kilpatrick, Ivan Vlassiouk   +2 more
exaly