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Kelvin probe force microscopy characterization of TiO2 (110)-supported Au clusters
Applied Physics Letters, 2011Ayhan Yurtsever +2 more
exaly
Kelvin Probe: Kelvin Probe Force Microscopy as a Tool for the Characterization of Nanomaterials
2016openaire +1 more source
Kelvin probe force microscopy for characterization of semiconductor devices and processes
Journal of Vacuum Science & Technology an Official Journal of the American Vacuum Society B, Microelectronics Processing and Phenomena, 1996exaly
Numerical analysis of kelvin probe force microscopy
2017Connolly, J.P. +7 more
openaire +1 more source