Results 231 to 240 of about 7,385 (266)

Note: On the deconvolution of Kelvin probe force microscopy data

Review of Scientific Instruments, 2010
In Kelvin probe force microscopy (KPFM) proper interpretation of the data is often difficult because the measured surface potential is affected by the interaction of the cantilever with the sample. In this work, the tip's interaction with a modeled surface potential distribution was simulated, leading to a calculated KPFM image.
A, Blümel, H, Plank, A, Klug, E, Fisslthaler, M, Sezen, W, Grogger, E J W, List   +6 more
openaire   +2 more sources

Kelvin Probe Force Microscopy of Semiconductors

2007
Due to their technological importance, III–V compound semiconductors have been widely studied. While extensive work has been done on their geometric and electronic structure, Kelvin probe force microscopy (KPFM) in ultrahigh vacuum (UHV) creates the possibility to study the electronic structure of the surfaces on a nanometer scale [1].
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner   +5 more
openaire   +1 more source

Principles of Kelvin Probe Force Microscopy

2007
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high ...
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks   +4 more
openaire   +1 more source

Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy

2004
In 1981, Gerd Binning and Heinrich Rohree at IBM Zurich developed the first generation of the scanning probe microscope, the scanning tunneling microscope for which they received the Noble Prize in physics. The Scanning Tunneling Microscope (STM) was a fantastic breakthrough with its capability to image atoms with angstrom precision.
C. Druffner, E. Schumaker, S. Sathish, G. S. Frankel, P. Leblanc   +4 more
openaire   +1 more source

Quantitative Analysis of Kelvin Probe Force Microscopy on Semiconductors

2018
As is well known, Kelvin Probe Force Microscopy (KPFM) is a powerful and versatile tool to measure the contact potential difference (CPD) in metals. Here, we discuss the application of KPFM for the investigation of semiconducting materials, where the interpretation of KPFM is complicated by band bending and surface charge.
Polak, Leo, Wijngaarden, Rinke J.
openaire   +1 more source

Resolution and contrast in Kelvin probe force microscopy

Journal of Applied Physics, 1998
The combination of atomic force microscopy and Kelvin probe technology is a powerful tool to obtain high-resolution maps of the surface potential distribution on conducting and nonconducting samples. However, resolution and contrast transfer of this method have not been fully understood, so far.
H. O. Jacobs, P. Leuchtmann, O. J. Homan, A. Stemmer   +3 more
openaire   +1 more source

Practical aspects of Kelvin probe force microscopy

Review of Scientific Instruments, 1999
We discuss practical aspects of Kelvin probe force microscopy (KFM) which are important to obtain stable images of the electric surface potential distribution at high spatial resolution (<100 nm) and high potential sensitivity (<1 mV) on conducting and nonconducting samples.
H. O. Jacobs, H. F. Knapp, A. Stemmer
openaire   +1 more source

Kelvin probe force microscopy of beveled semiconductors

Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 2002
For the first time, we present the results of Kelvin probe force microscope studies on beveled samples. The ease of sample preparation and simplicity of the measurement make this technique a good candidate for the rapid characterization of semiconductor multilayers.
R. S. Ferguson, K. Fobelets, L. F. Cohen
openaire   +1 more source

Kelvin Probe Force Microscopy with Atomic Resolution

2018
The surface potential distribution measured using Kelvin probe force microscopy (KPFM) is influenced by the contact potential difference (CPD) between the tip and surface, the stray capacitance of the cantilever, and fixed monopole charges on the surface and tip. The interpretation of atomic-scale KPFM contrast studies has been controversial.
Yan Jun Li, Haunfei Wen, Zong Min Ma, Lili Kou, Yoshitaka Naitoh, Yasuhiro Sugawara   +5 more
openaire   +1 more source

Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

2015
Kelvin probe force microscopy (KPFM) is applicable to measure surface potential and work function in a localized nanoscale surface area. In this chapter, we describe the theory and measurement of KPFM and its applications in the characterization of inorganic nanostructure and nanomaterials.
Da Luo, Hao Sun, Yan Li
openaire   +1 more source