Results 221 to 230 of about 25,733 (269)

Injection and Retention Characterization of Trapped Charges in Electret Films by Electrostatic Force Microscopy and Kelvin Probe Force Microscopy

Physica Status Solidi (a), 2020
Charge trapping memory has become a promising memory device due to its reliability, low cost, and simplicity. Its storage mechanism has attracted increasing attention.
Jin Wang, Hefang Zhang, G. Cao, Linghai Xie, Wei Huang   +4 more
semanticscholar   +1 more source

Open-loop band excitation Kelvin probe force microscopy

Nanotechnology, 2012
A multidimensional scanning probe microscopy approach for quantitative, cross-talk free mapping of surface electrostatic properties is demonstrated. Open-loop band excitation Kelvin probe force microscopy (OL BE KPFM) probes the full response-frequency-potential surface at each pixel at standard imaging rates.
Senli, Guo, Sergei V, Kalinin, Stephen, Jesse   +2 more
openaire   +2 more sources

Kelvin probe force microscopy: measurement data reconstruction

SPIE Proceedings, 2009
The Kelvin Probe Force Microscopy (KPFM) is a method to detect the surface potential of micro- and nanostructured samples using a common Scanning Probe Microscope (SPM). The electrostatic force has a very long range compared to other surface forces. By using SPM systems the KPFM measurements are performed in the noncontact region at surface distances ...
Torsten Machleidt, Erik Sparrer, Tim Kubertschak, Rico Nestler, Karl-Heinz Franke   +4 more
openaire   +1 more source

������������ �������������������� ������������������ �������������������� ���� ���� ���������� ������ ���������������� Kelvin Probe Force Microscopy

2009
The current essay deals with the Kelvin probe Force Microscopy (KPFM) technique. In the first chapter, the basic theoretical background is set together with some practical aspects that are crucial for the proper implementation of the experiments. In chapter 2, we focus on the most relevant parameters for the technique in order to figure out the manner ...
openaire   +1 more source

Kelvin probe force microscopy study on nanotriboelectrification

Applied Physics Letters, 2010
Nanotriboelectrification is studied by a Kelvin probe force microscopy (KFM)-based method. The electrostatic potentials produced by the friction between the atomic force microscope tips and the substrates are recorded with KFM and the electric quantity is calculated.
Hao Sun, Haibin Chu, Jinyong Wang, Lei Ding, Yan Li   +4 more
openaire   +1 more source

Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy

2004
In 1981, Gerd Binning and Heinrich Rohree at IBM Zurich developed the first generation of the scanning probe microscope, the scanning tunneling microscope for which they received the Noble Prize in physics. The Scanning Tunneling Microscope (STM) was a fantastic breakthrough with its capability to image atoms with angstrom precision.
C. Druffner, E. Schumaker, S. Sathish, G. S. Frankel, P. Leblanc   +4 more
openaire   +1 more source

Investigating 2D WS2 supercapacitor electrode performance by Kelvin probe force microscopy

Journal of Materials Chemistry A, 2020
Uncovering the mechanism behind the increase in capacitance of a 2D WS2 supercapacitor electrode upon cycling using KPFM analysis.
K. Sambath Kumar, Nitin Choudhary, Deepak Pandey, Yi Ding, Luis Hurtado, Hee-Suk Chung, L. Tetard, Yeonwoong Jung, Jayan Thomas   +8 more
semanticscholar   +1 more source

Kelvin Probe Force Microscopy of Semiconductors

2007
Due to their technological importance, III–V compound semiconductors have been widely studied. While extensive work has been done on their geometric and electronic structure, Kelvin probe force microscopy (KPFM) in ultrahigh vacuum (UHV) creates the possibility to study the electronic structure of the surfaces on a nanometer scale [1].
Y. Rosenwaks, S. Saraf, O. Tal, A. Schwarzman, Th. Glatzel, M. Ch. Lux-Steiner   +5 more
openaire   +1 more source

Practical aspects of Kelvin probe force microscopy

Review of Scientific Instruments, 1999
We discuss practical aspects of Kelvin probe force microscopy (KFM) which are important to obtain stable images of the electric surface potential distribution at high spatial resolution (<100 nm) and high potential sensitivity (<1 mV) on conducting and nonconducting samples.
H. O. Jacobs, H. F. Knapp, A. Stemmer
openaire   +1 more source

Principles of Kelvin Probe Force Microscopy

2007
In this chapter we describe and discuss Kelvin probe force microscopy (KPFM), a scanning probe microscopy technique designed to obtain laterally resolved work function images by measuring the electrostatic forces between probe and sample surface. By operating the microscope in ultrahigh vacuum, even absolute work function measurements with very high ...
Th. Glatzel, M.Ch. Lux-Steiner, E. Strassburg, A. Boag, Y. Rosenwaks   +4 more
openaire   +1 more source