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Kelvin probe force microscopy for perovskite solar cells

Science China Materials, 2019
Zhuo Kang, Qingliang Liao, Zheng Zhang
exaly  

Study of physical properties of antiphase boundaries in III-V epitaxial layer on silicon with conductive tip atomic force microscopy (C-AFM) and with Kelvin Probe Force Microscopy (KPFM) techniques.

Bernard, Rozenn   +10 more
openaire   +1 more source

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