Results 141 to 150 of about 3,384,291 (161)

Study of heterostructures of Cu₃BiS₃–buffer layer measured by Kelvin probe force microscopy measurements (KPFM)

Canadian Journal of Physics, 2014
The interface formed between Cu3BiS3 thin films and the buffer layer is a potentially limiting factor to the performance of solar cells based on Al/Cu3BiS3/buffer heterojunctions. The buffer layers of ZnS and In2S3 were grown by co-evaporation, and tested as an alternative to the traditional CdS deposited by chemical bath deposition.
F. Mesa, D. Fajardo
openaire   +1 more source

Cross-Talk Artefacts in Kelvin Probe Force Microscopy Imaging: A Comprehensive Study

Journal of Applied Physics, 2014
We provide in this article a comprehensive study of the role of ac cross-talk effects in Kelvin Probe Force Microscopy (KPFM), and their consequences onto KPFM imaging.
Heinrich Diesinger, Thierry Mélin
exaly   +2 more sources

Surface Potential Studies of Self-Assembling Monolayers Using Kelvin Probe Force Microscopy

Surface and Interface Analysis, 1999
The local contact potential difference (CPD) of different self-assembled n-alkanethiol monolayers on Au substrates has been measured using Kelvin probe force microscopy (KPFM).
Ernst Meyer, Roland Bennewitz, Emmanuel Delamarche   +2 more
exaly   +1 more source

Contrast Formation in Kelvin Probe Force Microscopy of Single π-Conjugated Molecules [PDF]

Nano Letters, 2014
We report the contrast formation in the local contact potential difference (LCPD) measured by Kelvin probe force microscopy (KPFM) on single charge-transfer complexes (CTCs) on a NaCl bilayer on Cu(111).
Shi-Xia Liu, Silvio Decurtins, Leo Gross
exaly   +2 more sources

Kelvin Probe Force Microscopy (KPFM) for nanoelectronic device characterisation [PDF]

, 2016
This project is to develope a new method of characterization for Silicon-nano-wire (SiNW) FET and SET devices by using KPFM technology to derive the information of local surface potential change on the channel of SiNW devices. The surface potential is related to many important parameters on material's surface, e.g.
openaire  

Pulsed Force Kelvin Probe Force Microscopy Through Integration of Lock-In Detection

Nano Letters, 2023
Zahra Fakhraai, Hui Fang, Devon S Jakob
exaly  

Torsional Harmonic Kelvin Probe Force Microscopy for High-Sensitivity Mapping of Surface Potential

IEEE Transactions on Industrial Electronics, 2022
Junyuan Geng, Xianghe Meng, Danish Hussain   +2 more
exaly  

Integrated Tapping Mode Kelvin Probe Force Microscopy With Photoinduced Force Microscopy for Correlative Chemical and Surface Potential Mapping

Small, 2021
Huanping Zhou, Devon S Jakob, Xiaoji G Xu   +2 more
exaly  

Utilizing the Surface Potential of a Solid Electrolyte Region as the Potential Reference in Kelvin Probe Force Microscopy

Beilstein Journal of Nanotechnology, 2022
Ishida Nobuyuki
exaly  

Quantitative Kelvin Probe Force Microscopy (KPFM)

D Kim, S Wood, F A Castro
openaire   +1 more source