Results 251 to 260 of about 5,616 (276)

KPFM/AFM imaging on TiO₂(110) surface in O₂ gas

Nanotechnology, 2018
We have carried out high-speed imaging of the topography and local contact potential difference (LCPD) on rutile TiO2(110) in O2 gas by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM). We succeeded in KPFM/AFM imaging with atomic resolution at 1 frame min-1 and observed the adsorbate on a hydroxylated TiO2(110) surface.
Eiji Arima, Huan Fei Wen, Yoshitaka Naitoh, Yan Jun Li, Yasuhiro Sugawara   +4 more
openaire   +2 more sources

In Situ KPFM Imaging of Local Photovoltaic Characteristics of Structured Organic Photovoltaic Devices

ACS Applied Materials & Interfaces, 2014
Here, we discuss the local photovoltaic characteristics of a structured bulk heterojunction, organic photovoltaic devices fabricated with a liquid carbazole, and a fullerene derivative based on analysis by scanning kelvin probe force microscopy (KPFM).
Satoshi, Watanabe, Yasumasa, Fukuchi, Masako, Fukasawa, Takafumi, Sassa, Atsushi, Kimoto, Yusuke, Tajima, Masanobu, Uchiyama, Takashi, Yamashita, Mutsuyoshi, Matsumoto, Tetsuya, Aoyama   +9 more
openaire   +2 more sources

Interpretation of KPFM Data with the Weight Function for Charges

2018
The KPFM signal for systems containing local charges can be expressed as a weighted sum over all local charges. The weight function for charges quantifies the contribution of each charge, depending on its position. In this chapter, we evaluate the KPFM weight function for charges by analyzing several application-relevant model systems. The intention of
Hagen Söngen, Philipp Rahe, Ralf Bechstein, Angelika Kühnle   +3 more
openaire   +1 more source

Molecular Assemblies on Insulating Ultrathin Films Analyzed by NC‐AFM and KPFM

Israel Journal of Chemistry, 2008
AbstractRecently porphyrin‐based molecules have proven to be promising candidates to form self‐assembled structures on insulating surfaces. Their close similarity to hemoglobin and chlorophyll‐based molecules makes them promising candidates for functional building parts in molecular electronics.
Glatzel, Thilo, Zimmerli, Lars, Meyer, Ernst   +2 more
openaire   +2 more sources

(Invited) Tip Cleaning and Sample Design for High Resolution MOSCAP x-KPFM

ECS Transactions, 2010
Kelvin probe force microscopy (KPFM) is a unique technique that can provide two dimensional potential profiles inside a working device. A procedure is described to obtain high-resolution KPFM results on ultra-high vacuum (UHV) cleaved III-V MOSCAPs. Two tip preparation methods: field emission and Cr coating show reproducible high spatial and energy ...
Wilhelm Melitz, Jian Shen, S. Lee, J.S. Lee, J.E. Royer, Steven Bentley, Douglas Macintyre, Martin Holland, Iain Thayne, Andrew C. Kummel   +9 more
openaire   +1 more source

KPFM and XPS Metrology of Self-Assembled Monolayer Barrier for Copper Metallization

ECS Meeting Abstracts, 2018
Silane based Self assembled monolayer (SAM) has been demonstrated as a diffusion barrier layer on lowK dielectrics for sub 10 nm Cu interconnects for Integrated Circuit (IC) applications. A key problem in developing barrier layer is its monitoring capability, especially its thickness, uniformity, its coverage and defect density.
Rakefet Ofek Almog, Yelena Sverdlov, Kian Kadan, Larisa Burstein, Ronen Dagan, Yosi Shacham-Diamand   +5 more
openaire   +1 more source

Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

Organic and Hybrid Field-Effect Transistors XIX, 2020
Using Kelvin Probe Force Microscopy (KPFM), we performed surface-potential measurements on operating organic thin-film transistors (TFTs). Several parameters inaccessible through current-voltage measurements were determined, namely the source and drain resistances separately, the threshold voltage and the electric field along the channel.
Mélanie Brouillard, Ute Zschieschang, Nicolas Bogdan Bercu, Olivier Simonetti, Hagen Klauk, Louis Giraudet   +5 more
openaire   +1 more source

Unveiling spatially resolved charge transfer in S-scheme heterojunctions via KPFM

Chinese Journal of Catalysis
Shan Wang, Bei Cheng, Kezhen Qi
exaly   +2 more sources

Coupling atomic scale modeling, fluid modeling and KPFM measurements to characterize an interface at nanoscale

2016 IEEE International Conference on Dielectrics (ICD), 2016
Understanding the behaviour of space charge in a solid organic dielectric under electrical stress remains to be a challenge for the development of more compact and reliable systems in the fields ranging from high voltage engineering and microelectronics to space applications.
Le Roy, Séverine, Villeneuve-Faure, Christina, Chang, J. H., Huzayyin, A.   +3 more
openaire   +1 more source

Applications of KPFM-Based Approaches for Surface Potential and Electrochemical Measurements in Liquid

2018
Kelvin probe force microscopy (KPFM) has been widely used to map nanoscale surface potentials of materials in ambient and ultra-high vacuum environments. However, to study and ultimately understand charge-related processes, e.g., in biological systems or to further improve energy storage devices such as electrochemical batteries, nanoscale surface ...
Collins, Liam, Weber, Stefan A.L., Rodriguez, Brian J.   +2 more
openaire   +1 more source