Results 271 to 280 of about 5,628 (300)
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Nanoscale mapping using AFM and KPFM in Er/Yb:BaTiO3 films to photonics applications
Latin America Optics and Photonics (LAOP) Conference 2022, 2022The functionalization of advanced materials for photonics devices is dependent on nanoscale mapping. Technique AFM and KPFM were used to investigate the surface evolution and quantitative information is discussed.
J. L. Clabel H., E. Marega
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KPFM and PFM of Biological Systems
2011Surface potentials and electrostatic interactions in biological systems are key elements of cellular regulation and interaction. Examples include cardiac and muscular activity, voltage-gated ion channels, protein folding and assembly, and electroactive cells and electrotransduction.
B. J. Rodriguez, S. V. Kalinin
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High resolution subsurface imaging using resonance-enhanced detection in 2nd-harmonic KPFM
Nanotechnology, 2018Second harmonic Kelvin probe force microscopy is a robust mechanism for subsurface imaging at the nanoscale. Here we exploit resonance-enhanced detection as a way to boost the subsurface contrast with higher force sensitivity using lower bias voltages, in comparison to the traditional off-resonance case.
Maria J Cadena +2 more
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Probing Local Surface Potential of Quasi‐One‐Dimensional Systems: A KPFM Study of P3HT Nanofibers
Advanced Functional Materials, 2008AbstractA new model for the quantitative analysis of Kelvin Probe Force Microscopy (KPFM) measurements of quasi‐one‐dimensional systems is presented. It is applied to precisely determine the local surface potential (SP) of semiconducting nanofibers of poly(3‐hexylthiophene) (P3HT) self‐assembled on various flat substrates.
Andrea Liscio, Vincenzo Palermo
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Imaging Static Charge Distributions: A Comprehensive KPFM Theory
2018We analyze Kelvin probe force microscopy (KPFM) for tip-sample systems that contain static charges by presenting a rigorous derivation for the respective KPFM signal in all common KPFM modes, namely amplitude modulation, frequency modulation, or heterodyne detection in the static, open-loop or closed-loop variant.
Philipp Rahe, Hagen Söngen
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KPFM/AFM imaging on TiO2(110) surface in O2 gas
Nanotechnology, 2018We have carried out high-speed imaging of the topography and local contact potential difference (LCPD) on rutile TiO2(110) in O2 gas by atomic force microscopy (AFM) and Kelvin probe force microscopy (KPFM). We succeeded in KPFM/AFM imaging with atomic resolution at 1 frame min-1 and observed the adsorbate on a hydroxylated TiO2(110) surface.
Eiji Arima +4 more
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Interpretation of KPFM Data with the Weight Function for Charges
2018The KPFM signal for systems containing local charges can be expressed as a weighted sum over all local charges. The weight function for charges quantifies the contribution of each charge, depending on its position. In this chapter, we evaluate the KPFM weight function for charges by analyzing several application-relevant model systems. The intention of
Hagen Söngen +3 more
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Molecular Assemblies on Insulating Ultrathin Films Analyzed by NC‐AFM and KPFM
Israel Journal of Chemistry, 2008AbstractRecently porphyrin‐based molecules have proven to be promising candidates to form self‐assembled structures on insulating surfaces. Their close similarity to hemoglobin and chlorophyll‐based molecules makes them promising candidates for functional building parts in molecular electronics.
Glatzel, Thilo +2 more
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(Invited) Tip Cleaning and Sample Design for High Resolution MOSCAP x-KPFM
ECS Transactions, 2010Kelvin probe force microscopy (KPFM) is a unique technique that can provide two dimensional potential profiles inside a working device. A procedure is described to obtain high-resolution KPFM results on ultra-high vacuum (UHV) cleaved III-V MOSCAPs. Two tip preparation methods: field emission and Cr coating show reproducible high spatial and energy ...
Wilhelm Melitz +9 more
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KPFM and XPS Metrology of Self-Assembled Monolayer Barrier for Copper Metallization
ECS Meeting Abstracts, 2018Silane based Self assembled monolayer (SAM) has been demonstrated as a diffusion barrier layer on lowK dielectrics for sub 10 nm Cu interconnects for Integrated Circuit (IC) applications. A key problem in developing barrier layer is its monitoring capability, especially its thickness, uniformity, its coverage and defect density.
Rakefet Ofek Almog +5 more
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