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Surface composition of perovskite-type materials studied by Low Energy Ion Scattering (LEIS)
Solid State Ionics, 2014Tatsumi Ishihara, John A Kilner
exaly
The isotope exchange depth profiling (IEDP) technique using SIMS and LEIS
Journal of Solid State Electrochemistry, 2011John A Kilner, Stephen J Skinner
exaly
AS ALTERAÇÕES NO CONTROLE DE JORNADA NA LEI DA LIBERDADE ECONÔMICA - LEI Nº 13.874
2020Maria Luísa Oliveira Elias Santana +1 more
openaire +1 more source
Highly Sensitive Detection of Surface and Intercalated Impurities in Graphene by LEIS
Langmuir, 2015Pavel Procházka +2 more
exaly

