Results 181 to 190 of about 4,639 (235)
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IEEE Workshop on Wide Bandgap Power Devices and Applications, 2022
Reliability tests are a decisive step for GaN technology qualification. To evaluate the Mean Time to Failure (MTTF), it is necessary to know well the peak channel temperature (Tpeak) reached at the hottest point of the device.
C. Miccoli +5 more
semanticscholar +1 more source
Reliability tests are a decisive step for GaN technology qualification. To evaluate the Mean Time to Failure (MTTF), it is necessary to know well the peak channel temperature (Tpeak) reached at the hottest point of the device.
C. Miccoli +5 more
semanticscholar +1 more source
Benefits of Finer Semiconductor Device Granularity on Power Converter Thermal Stress and MTTF
Annual Conference of the IEEE Industrial Electronics Society, 2021This article explores the thermal and reliability benefits of configuring the power semiconductor block of power converters with several small standard power semiconductor devices instead of a few larger ones at a fixed total chip area. The effectiveness
Roya Rafiezadeh +2 more
semanticscholar +1 more source
A novel MTTF estimator and associated parameter estimation method on heavily censoring data
Quality and Reliability Engineering International, 2020Many reliability and maintenance decision problems need to estimate mean‐time‐to‐failure (MTTF) of a particular product component and/or build its life distribution model as early as possible based on field failure data.
R. Jiang
semanticscholar +1 more source
Design of fault‐tolerant control for MTTF
International Journal of Robust and Nonlinear Control, 2008AbstractMean time to failure (MTTF) is an important reliability index of fault‐tolerant control systems, which is chosen as a design objective in this paper. However, it is usually evaluated from stochastic reliability models, and no analytical expression is available to relate MTTF to controller parameters.
Li, Hongbin, Zhao, Qing
openaire +2 more sources
The failure of MTTF in availability evaluation
Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318), 2003In this paper, a truncated bathtub is proposed to model the failure rate of a product with perfect burn-in. We expose some counter-intuition observations, e.g., increasing the MTTF does not necessarily increase the average and instantaneous availability during the product's lifetime, and the average and instantaneous availability could be improved ...
null Hairong Sun, J.J. Han
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Relative MTTF-Based Incentive Scheme for Availability-Based Replication in P2P Systems
IEICE Transactions on Information and Systems, 2010 When P2P systems are used for data sensitive systems, the data availability has become an important issue. The availability-based replication using individual node availability is the most popular method keeping high data availability efficiently ...
Kyungbaek Kim
exaly +2 more sources
A simple Markovian method for MTTF calculation
Microelectronics Reliability, 1987Abstract The MTTF of a system design with constant failure and repair rates and with some forms of stand-by redundancy and switching is an important characteristic of the system. Commonly, calculation of the MTTF requires knowledge of the reliability function R(t), which is integrated to yield the MTTF.
A. Dubi, A. Goldfeld, D. Sasson
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Cryocooler MTTF prediction at high operating temperature
Infrared Technology and Applications Lexaly +2 more sources
Toward a BITE for real time MTTF estimation of capacitors
2010 IEEE Instrumentation & Measurement Technology Conference Proceedings, 2010The use of an equipment able to provide a real time diagnostic of a monitored device (BITE) allows to increase reliability and to decrease costs. BITE operates on the basis of a suitable life model of the considered device that must relate time to failure with past and present stresses.
ALBERTINI, ANDREA +4 more
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