Results 141 to 150 of about 3,419 (196)

Publisher Correction: Ultracompact mirror device for forming 20-nm achromatic soft-X-ray focus toward multimodal and multicolor nanoanalyses. [PDF]

Nat Commun
Shimamura T, Takeo Y, Moriya F, Kimura T, Shimura M, Senba Y, Kishimoto H, Ohashi H, Shimba K, Jimbo Y, Mimura H.   +10 more
europepmc   +1 more source

Standard Sample in Dimensional Nanometrology

Journal of the Japan Society for Precision Engineering, 2008
openaire   +2 more sources

Replicating Spectral Baseline for Unambiguous Frequency Locking in Resonant Sensors. [PDF]

Sensors (Basel)
Setiono A, Nelfyenny, Nyang'au WO, Peiner E.   +3 more
europepmc   +1 more source

Generalized analysis of dynamic pull-in for singular magMEMS and MEMS oscillators. [PDF]

Sci Rep
Skrzypacz P, Ellis G, Pruchnik B, Putek P.   +3 more
europepmc   +1 more source

Nanoparticle Metrology of Silicates Using Time-Resolved Multiplexed Dye Fluorescence Anisotropy, Small Angle X-ray Scattering, and Molecular Dynamics Simulations. [PDF]

Materials (Basel)
Doveiko D, Martin ARG, Vyshemirsky V, Stebbing S, Kubiak-Ossowska K, Rolinski O, Birch DJS, Chen Y.   +7 more
europepmc   +1 more source

Label-Free Screening of Drug-Induced Liver Injury Using Stimulated Raman Scattering Microscopy and Spectral Phasor Analysis. [PDF]

Anal Chem
Tipping WJ, Wilson LT, Tomkinson NCO, Faulds K, Graham D.   +4 more
europepmc   +1 more source

Enabling data-driven design of block copolymer self-assembly. [PDF]

Sci Data
Magosso C, Murataj I, Perego M, Seguini G, Audus DJ, Milano G, Ferrarese Lupi F.   +6 more
europepmc   +1 more source

2D Super-Resolution Metrology Based on Superoscillatory Light. [PDF]

Adv Sci (Weinh)
Wang Y, Chan EA, Rendón-Barraza C, Shen Y, Plum E, Ou JY.   +5 more
europepmc   +1 more source

Control of Cytocompatible Metallic and Polymeric Wrinkle Morphologies Using Programming via Printing (PvP). [PDF]

ACS Omega
Agyapong JN, Zhang T, Henderson JH.
europepmc   +1 more source

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Single-cavity loss-enabled nanometrology

Nature Nanotechnology
Optical monitoring of the position and alignment of objects with a precision of only a few nanometres is key in applications such as smart manufacturing and force sensing. Traditional optical nanometrology requires precise nanostructure fabrication, multibeam interference or complex postprocessing algorithms, sometimes hampering wider adoption of this ...
Cheng Wei Qiu, yuanhao Mao, Ken Liu
exaly   +3 more sources