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Hyperspectral X-ray imaging for nanometrology
KristallografiâA tool for X-ray hyperspectral imaging has been developed. It is based on a conventional CCD driven by an algorithm that allows resolution in both energy and position. A new algorithm has been developed that allows the real-time analysis of single photon events.
A. I. Safonov +2 more
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Contributions of Capillary Electrophoresis in Analytical Nanometrology: A Critical View
Critical Reviews in Analytical Chemistry, 2022Carlos Adelantado +2 more
exaly
Linear and traceable scales for nanometrology: Dissertation
2014Methods for the implementation of reliable, repeatable scales are central to all measurementtechniques. Laser interferometers and diffractometers can be used for accurate dimensionalmeasurements that are readily traceable to the definitions of the SI (Système International) units.
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Nanometrology - The Frontier of Precision
2005Nanotechnology, the engineering that deals with the production of systems whose tolerances lie in the domain of nanometers, is becoming increasingly important in many industrial fields. In order that nanotechnology create viable, commercial products, ultra-precision metrology will be required.
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