Results 171 to 180 of about 1,529 (201)

Errors in nanometrology by SEM

Nanotechnology, 2004
Scanning electron microscopy (SEM) is widely used for the inspection of nanostructures such as nanocrystallites and nanotubes as well as quantum wells and many other sub-micrometre devices. Some published papers show that the apparent size of small details in SEM images appear larger than their real dimension as obtained from transmission electron ...
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Tools for Nanomanipulation and Nanometrology

Microscopy and Microanalysis, 2004
Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.
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Nanometrology

Metrologia, 1991
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Nanometrology - The Frontier of Precision

2005
Nanotechnology, the engineering that deals with the production of systems whose tolerances lie in the domain of nanometers, is becoming increasingly important in many industrial fields. In order that nanotechnology create viable, commercial products, ultra-precision metrology will be required.
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Contributions of Capillary Electrophoresis in Analytical Nanometrology: A Critical View

Critical Reviews in Analytical Chemistry, 2022
CARLOS Adelantado, Mohammed Zougagh, Angel Rios   +2 more
exaly  

Carbon dots – Separative techniques: Tools-objective towards green analytical nanometrology focused on bioanalysis

Microchemical Journal, 2021
Fernando DE ANDRÉS, Angel Rios
exaly  

Nanometrology

Smart Materials Bulletin, 2002
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Metrology and Nanometrology at Agricultural/Food/Nutraceutical Interface: An Updated Shot

Current Bioactive Compounds, 2022
Antonello Santini, Eliana B Souto, Aleksandra Zielinska   +2 more
exaly  

Handbook of Surface and Nanometrology

2002
Introduction-Surface and Nanometrology General Surface Metrology Background to Surface Metrology Nanometrology Book Structure Characterization The Nature of Surfaces Surface Geometry Assessment and Parameters Characterization Waviness Errors of Form Characterization of Structured and Free Form Surfaces Characterization of Defects on the Surface ...
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3D Nanomanufacturing and Nanometrology

2017
Further scaling and miniaturization of nanodevices (nanoelectronics, Quantum devices bio-nano devices for healthcare) brings major manufacturing, metrology and characterization challenges that cannot be met anymore by current techniques. The High Volume Manufacturing industry requires, more than ever, metrology methods that routinely measure structural
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