Results 171 to 180 of about 3,419 (196)
Some of the next articles are maybe not open access.
Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film
Nature Communications, 2018Zengji Yue, Hao-Ran Ren, Shibiao Wei
exaly
3D Nanomanufacturing and Nanometrology
2017Further scaling and miniaturization of nanodevices (nanoelectronics, Quantum devices bio-nano devices for healthcare) brings major manufacturing, metrology and characterization challenges that cannot be met anymore by current techniques. The High Volume Manufacturing industry requires, more than ever, metrology methods that routinely measure structural
openaire +1 more source
Helium ion microscopy and its application to nanotechnology and nanometrology
Scanning, 2008András E Vladár
exaly
The Scherrer equation versus the 'Debye-Scherrer equation'
Nature Nanotechnology, 2011Uwe Holzwarth, Peter Peter Neil Gibson
exaly
Towards fast AFM-based nanometrology and nanomanufacturing
International Journal of Nanomanufacturing, 2012Georg Schitter, Urs Staufer
exaly
Current Situation and Prospect of Nanometrology and its Standardization in Indonesia
Mapan - Journal of Metrology Society of India, 2018Beni Adi Trisna +2 more
exaly
Atomic Force Microscopy as a Nanometrology Tool: Some Issues and Future Targets
Mapan - Journal of Metrology Society of India, 2013Gargi Raina
exaly

