Results 171 to 180 of about 3,419 (196)
Some of the next articles are maybe not open access.

Angular-momentum nanometrology in an ultrathin plasmonic topological insulator film

Nature Communications, 2018
Zengji Yue, Hao-Ran Ren, Shibiao Wei
exaly  

3D Nanomanufacturing and Nanometrology

2017
Further scaling and miniaturization of nanodevices (nanoelectronics, Quantum devices bio-nano devices for healthcare) brings major manufacturing, metrology and characterization challenges that cannot be met anymore by current techniques. The High Volume Manufacturing industry requires, more than ever, metrology methods that routinely measure structural
openaire   +1 more source

Optical Nanometrology

Journal of the Society of Mechanical Engineers, 1992
openaire   +1 more source

Nanometrology

2011
openaire   +1 more source

The Scherrer equation versus the 'Debye-Scherrer equation'

Nature Nanotechnology, 2011
Uwe Holzwarth, Peter Peter Neil Gibson
exaly  

Towards fast AFM-based nanometrology and nanomanufacturing

International Journal of Nanomanufacturing, 2012
Georg Schitter, Urs Staufer
exaly  

Current Situation and Prospect of Nanometrology and its Standardization in Indonesia

Mapan - Journal of Metrology Society of India, 2018
Beni Adi Trisna   +2 more
exaly  

Atomic Force Microscopy as a Nanometrology Tool: Some Issues and Future Targets

Mapan - Journal of Metrology Society of India, 2013
Gargi Raina
exaly  

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