Results 151 to 160 of about 3,419 (196)
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Nanotechnology, 2012
A new cationic silver N-alkylpyridylporphyrin complex is able to 'sense' nanometric conductive particles with a diameter below 10 nm. The luminescence of the molecule changes its maximum from red to blue when it embraces a conductive (metallic or semiconducting) nanoparticle.
G A M, Safar +5 more
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A new cationic silver N-alkylpyridylporphyrin complex is able to 'sense' nanometric conductive particles with a diameter below 10 nm. The luminescence of the molecule changes its maximum from red to blue when it embraces a conductive (metallic or semiconducting) nanoparticle.
G A M, Safar +5 more
openaire +2 more sources
Nanometrological micromachined artefacts
Journal of Micromechanics and Microengineering, 1992The fabrication of some unique artefacts with critical dimensions from deep submicron to several microns is described. These have been fabricated in silicon, in phosphosilicate glass (PSG) and in polysilicon films. The thermal reflow properties of PSG have been used to obtain artefacts with smooth spherical and cylindrical surfaces and the phosphorus ...
Ensell, G. +4 more
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Plasmonic Lens for Nanometrology
Key Engineering Materials, 2010In this paper, we presented plasmonic lens using metallic nanostructures to manipulate light based on surface plasmon polaritons for subwavelength focusing and collimation. We then proposed the use of plasmonic lens in the field of nanophotonics as a micro-photonic-device for nanometrology and sensing/detection purposes.
Jun Wang, Wei Zhou
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Nanometrology for industrial applications
e & i Elektrotechnik und Informationstechnik, 1998The development of continuously decreasing workpiece tolerances lies in one line with the perspective of nanotechnology. To fulfil metrological demands since about 1982 new high resolution and high precision measuring devices have been developed. These are computerized instruments and the measuring results are very illustrative figures of tested ...
D. Prostrednik, P. H. Osanna
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Bayesian inference for plasmonic nanometrology
Physical Review A, 2021We introduce a Bayesian method for the characterization of plasmonic nanoparticles, which is applicable to both near- and far-field problems. Designed to combine data generated from any photon-plasmon interaction experiment with physically motivated theoretical models, our approach leverages state-of-the-art Markov chain Monte Carlo sampling techniques
Joseph M. Lukens, Ali Passian
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Dimensional nanometrology at PTB
2012 IEEE International Instrumentation and Measurement Technology Conference Proceedings, 2012Dimensional metrology for micro- and even nanometer-sized objects is becoming increasingly important in industry branches like semiconductor and optical industries as well as in the fields of mechanical engineering, biology and medicine. To achieve the required small uncertainties and probing flexibility new measurement systems have been developed in ...
H.-U. Danzebrink +6 more
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Metrologia, 1991
The Physikalisch-Technische Bundesanstalt (PTB) is engaged in a range of projects which call for dimensional precision of order 1 nm. These include research and development (i) to improve linear and angular displacement metrology; (ii) to investigate the physical interaction of high resolution probes with technical surfaces and microstructures and so ...
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The Physikalisch-Technische Bundesanstalt (PTB) is engaged in a range of projects which call for dimensional precision of order 1 nm. These include research and development (i) to improve linear and angular displacement metrology; (ii) to investigate the physical interaction of high resolution probes with technical surfaces and microstructures and so ...
openaire +1 more source
2005
A survey of the nanometrology-related activities in progress at the Istituto di Metrologia “G. Colonnetti” (IMGC) is presented. Some special apparatus for critical measurements in the nanoscale range are described. The development of instrumentation and methods for quantitative scanning probe microscopy, optical diffractometry, and atomic scale ...
BISI, MARCO +4 more
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A survey of the nanometrology-related activities in progress at the Istituto di Metrologia “G. Colonnetti” (IMGC) is presented. Some special apparatus for critical measurements in the nanoscale range are described. The development of instrumentation and methods for quantitative scanning probe microscopy, optical diffractometry, and atomic scale ...
BISI, MARCO +4 more
openaire +1 more source