Results 151 to 160 of about 4,233 (222)

Fast and accurate: high-speed metrological large-range AFM for surface and nanometrology

, 2018
G. Dai, L. Koenders, J. Flügge, M. Hemmleb   +3 more
semanticscholar   +1 more source

Metrology AFM and Nanometrology

Hyomen Kagaku, 2006
openaire   +2 more sources

Nanometrology by X-ray Interferometry

Measurement + Control, 1998
D G Chetwynd
doaj   +1 more source

Publisher Correction: Ultracompact mirror device for forming 20-nm achromatic soft-X-ray focus toward multimodal and multicolor nanoanalyses. [PDF]

Nat Commun
Shimamura T, Takeo Y, Moriya F, Kimura T, Shimura M, Senba Y, Kishimoto H, Ohashi H, Shimba K, Jimbo Y, Mimura H.   +10 more
europepmc   +1 more source

Replicating Spectral Baseline for Unambiguous Frequency Locking in Resonant Sensors. [PDF]

Sensors (Basel)
Setiono A, Nelfyenny, Nyang'au WO, Peiner E.   +3 more
europepmc   +1 more source

Flexible Control in Nanometrology

, 2019
Popan, Gheorghe, Daraban, Ana Elisabeta Oros   +1 more
openaire   +3 more sources

Measurement Standards for Nanometrology

The Journal of The Institute of Electrical Engineers of Japan, 2005
openaire   +2 more sources

Generalized analysis of dynamic pull-in for singular magMEMS and MEMS oscillators. [PDF]

Sci Rep
Skrzypacz P, Ellis G, Pruchnik B, Putek P.   +3 more
europepmc   +1 more source

Standard Sample in Dimensional Nanometrology

Journal of the Japan Society for Precision Engineering, 2008
openaire   +2 more sources

Lateral deflection-based optimization achieves sub-picometer detection limit. [PDF]

Microsyst Nanoeng
Jiang Q, Qiao B, Ding X, Xu Y, Hu H.
europepmc   +1 more source